Conductivity of Josephson Junctions under a Dissipative Environment

Ilaria Cacciari, Anedio Ranfagni, Paolo Moretti

Frank K. Wilhelm, Gerd Schön, Gergely T. Zimányi

We study a superconducting single-charge transistor, where the coherence of Cooper pair tunneling is destroyed by the coupling to a tunable dissipative environment. Sequential tunneling and cotunneling processes are analyzed to construct the shape of the conductance peaks and their dependence on the dissipation and temperature. Unexpected features are found due to a cross-over between two distinct regimes, one `environment-assisted' the other `environment-dominated'. Several of the predictions have been confirmed by recent experiments. The model and results apply also to the dynamics of Josephson junction quantum bits on a conducting ground plane, thus explaining the influence of dissipation on the coherence.

P. Joyez

Frank K. Wilhelm, Gerd Schön, Gergely T. Zimányi

We study a superconducting single-charge transistor, where the coherence of Cooper pair tunneling is destroyed by the coupling to a tunable dissipative environment. Sequential tunneling and cotunneling processes are analyzed to construct the shape of the conductance peaks and their dependence on the dissipation and temperature. Unexpected features are found due to a crossover between two distinct regimes, one "environment assisted" the other "environment dominated." Several of the predictions have been confirmed by recent experiments. The model and results apply also to the dynamics of Josephson junction quantum bits on a conducting ground plane, thus explaining the influence of dissipation on the coherence.

Jian Zhou, Juan Wang, Yewen Yao +3 more

The critical current (Ic) of a Josephson junction (JJ) is a significant physical parameter that plays a crucial role in the design of subsequent devices and circuits, as well as in the optimization of manufacturing processes. To ensure accurate measurements, testing should ideally be conducted in a magnetically shielded room. However, due to laboratory constraints, tests are often performed in unshielded environments, where they are inevitably influenced by various environmental noises. This introduces significant uncertainty into the measured Ic values, thereby impacting the design of subsequent superconducting circuits. This study examines the impact of conductive, radiated, and flux noise on the repeatability of Ic measurements in an unshielded environment and establishes an empirical formula for predicting Ic values in shielded environments based on unshielded data. The deviation between the empirically predicted Ic and the experimentally measured value is less than 1%, verifying the effectiveness of the proposed formula. This approach offers a relatively accurate and cost-effective method for testing the critical current (Ic) of Josephson junctions (JJs) under unshielded conditions.

A. I. Larkin, Yu. N. Ovchinnikov