IEEE Latin American Test Symposium (LATS)

Qubit-driven Fault Simulation

Vladimir I. Hahanov, Wajeb Gharibi, Eugenia I. Litvinova, Svetlana V. Chumachenko

Published Mar 1, 2019• 25 citations

Abstract

Quantum data structures, methods, algorithms and software applications for parallel solution of combinatorial problems, including design and test, on classical computers by using extra memory are proposed. Quantum models and methods for design and test of specific logic functionalities are developed based on the use of vector qubit data structures and memory-driven architectures for parallel computing algorithms, in order to significantly improve the performance of testing and deductive simulation of digital systems-on-chips. A new quantum method of test generation for single stuck-at faults of logic functions through taking Boolean derivatives with respect to their qubit coverages is proposed. The quantum method of deductive simulation of stuck-at faults of logical functions through the synthesis of matrices of Boolean derivatives with respect to their qubit coverage has been developed. The performance of methods for test synthesis and their analysis has no analogues in algorithmic performance.

DOI: 10.1109/latw.2019.8704583

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