Optimal Metagrating for Position Metrology under Poisson Shot Noise
Zheng Xi, Sander Konijnenberg, Hendrik Paul Urbach
Abstract
We introduce an optimal metagrating design for position metrology under Poisson shot noise. By using proper electric and magnetic resonances inside the metagrating, the position of the metagrating within an interference field can be extracted with high precision in the presence of shot noise, leading to nearly three orders of magnitude improvement compared to the centroid-fitting-based position metrology with the same number of detected photons. Furthermore, we find that the improvement in precision is closely related to the formation of a phase vortex around the optimal design in the parameter space. The link between the metagrating design, the formation of a phase vortex and the fundamental precision limit using classical light gives new insights to all of these fields.