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IEEE Transactions on Applied Superconductivity

Excess Low-Frequency Flux Noise in dc SQUIDs | NIST

M. E. Huber, Michael W. Cromar, Ronald H. Ono

Published Jun 1, 1997• 0 citations
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We examine the behavior of low frequency flux noise measured in ten Nb-NbOx-Pbln dc SQUIDs in the temperature range 1 K to 20 mK. As previously reported, the flux noise power spectrum SΦ(f) typically scales with frequency as A/fα. Remark ably, the excess noise power A at 1 Hz increases as the temperature is decreased below about 0.7 K, saturating to a value around (10 μΦα)2/Hz below about 0.2 K. Here we report on the dependence of both the magnitude A and the slope a on the size and linewidth of the SQUID loops. In particular, at the lowest temperatures we find that a declines to values as low as 0.5 in the smallest devices, while a is in the range 0.9-1 for the largest devices.

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Excess low-frequency flux noise in dc SQUIDs

M. E. Huber, Michael W. Cromar, Ronald H. Ono

We have fabricated dc superconducting quantum interference devices (SQUIDs) incorporating Nb/Al-oxide/Nb Josephson junctions in both stripline and washer geometries. Low-frequency noise in excess of that predicted by the resistively-shunted junction model is present in both geometries and is demonstrated to be flux noise. This flux noise is not environmental. Improvements in fabrication processing over the past four years have reduced the level of this flux noise. SQUIDs are now fabricated with PdAu resistors, Nb wiring layers, and SiO/sub 2/ interlayer dielectric. In our best well-coupled SQUIDs, the white-noise energy sensitivity is 5/spl times/10/sup -31/ J/spl middot/s, with a 1/f knee below 0.1 Hz. We believe further reduction in the flux noise might be obtained with the use of on-chip flux shielding and/or trapping structures.

IEEE Transactions on Applied Superconductivity•Jun 1, 1997•5 citations
We examine the behavior of low frequency flux noise measured in ten Nb-NbOx-Pbln dc SQUIDs in the temperature range 1 K to 20 mK. As previously reported, the flux noise power spectrum SΦ(f) typically scales with frequency as A/fα. Remark ably, the excess noise power A at 1 Hz increases as the temperature is decreased below about 0.7 K, saturating to a value around (10 μΦα)2/Hz below about 0.2 K. Here we report on the dependence of both the magnitude A and the slope a on the size and linewidth of the SQUID loops. In particular, at the lowest temperatures we find that a declines to values as low as 0.5 in the smallest devices, while a is in the range 0.9-1 for the largest devices.
We have fabricated dc superconducting quantum interference devices (SQUIDs) incorporating Nb/Al-oxide/Nb Josephson junctions in both stripline and washer geometries. Low-frequency noise in excess of that predicted by the resistively-shunted junction model is present in both geometries and is demonstrated to be flux noise. This flux noise is not environmental. Improvements in fabrication processing over the past four years have reduced the level of this flux noise. SQUIDs are now fabricated with PdAu resistors, Nb wiring layers, and SiO/sub 2/ interlayer dielectric. In our best well-coupled SQUIDs, the white-noise energy sensitivity is 5/spl times/10/sup -31/ J/spl middot/s, with a 1/f knee below 0.1 Hz. We believe further reduction in the flux noise might be obtained with the use of on-chip flux shielding and/or trapping structures.