Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Scientific Reports

Hotspot relaxation time of NbN superconducting nanowire single-photon detectors on various substrates

Lu Zhang, Lixing You, Xiaoyan Yang, Junjie Wu, Chaolin Lv, Qi Guo, Weijun Zhang, Hao Li, Wei Peng, Zhen Wang, Xiaoming Xie

Published Jan 18, 2018• 51 citations
Publisher

Abstract

Abstract Hotspot relaxation time (τ th ) is one of the essential parameter which defines the maximum count rate of superconducting nanowire single-photon detectors (SNSPDs). We studied the τ th for NbN-based SNSPDs on various substrates using the two-photon detection method based on the pump-probe spectroscopy technique. We observed that τ th strongly increased with increasing bias current in the two-photon detection regime. In addition, the minimum hotspot relaxation time (τ th )min was not significantly affected by the bath temperature; this is different from the previous observations reported for WSi SNSPDs. In addition, a strong dependency of (τ th )min on the substrate was found. The minimum (τ th )min was 11.6 ps for SNSPDs made of 5.5-nm-thick NbN on MgO (100), whereas the maximum (τ th )min was 34.5 ps for SNSPDs made of 7.5-nm-thick NbN on Si (100). We presented a direct correlation between the values of τ th and degrees of disorder of NbN films grown on different substrates.

DOI
10.1038/s41598-018-20035-7

Related papers

Hotspot relaxation time in disordered niobium nitride films

Lu Zhang, Lixing You, Xiaoyan Yang +8 more

The hotspot relaxation time (τth) was systematically studied on superconducting nanowire single-photon detectors (SNSPDs) made from ultrathin NbN films with different substrates and chemical compositions. The τth values were measured to be between 9.2 ps and 41.1 ps at the bath temperature of 2.15 K. The temperature dependence of τth ∝ TC−1.5 was observed, which indicated a dominant electron-phonon scattering relaxation mechanism in disordered NbN films. In addition, the increase in τth results in a higher latching probability in NbN-based SNSPDs with the same electrical response time (τe). The experimental results confirmed that the devices suffered latching when the ratio of the electric and thermal relaxation time was less than 133. This observation is an interesting reference for the design and process optimization of SNSPDs.

Applied Physics Letters•Sep 23, 2019•8 citations

Effect of thermal conductance on the performance of superconducting nanowire single-photon detectors (SNSPDs)

Nicolò Petrini

The hotspot dynamics is one of the key process involved in the detection mechanism in superconducting nanowires single photon detectors (SNSPDs). The energy delivered by the photon absorption creates a non-equilibrium region where Cooper pairs break into quasi-particles, which undergo a thermalization process involving hot-electron–phonon interactions within the superconducting film. Eventually, phonons dissipate the excess energy into the substrate and relax to the base temperature. Hence, intrinsic reset time, count rate and possibly other parameters are conceivably affected by thermal coupling between the substrates and the superconducting film. Thus, a detailed understanding of the thermal boundary conductance is crucial for achieving the best possible performances. Even though recent studies have demonstrated that the substrate plays an important role in defining the hotspot relaxation time, no systematic study on the influence on detector performance metrics has been carried out yet. In this work, we investigated the effect of different substrates on SNSPDs performance. Meandered detectors and single nanowires with various dimensions have been successfully fabricated on ultrathin NbN film sputtered on six substrates: SiO2, Al2O3, SiC, SiN, AlN and GaN. We characterized the deposited films measuring Tc, ρ, ΔTc and RRR. Lattice mismatch is known to play an important role in determining the resulting film quality. SiO2 and SiN samples, in which the mismatch is pronounced, showed lower Tc and higher ρ compared to the other substrates. We extracted the critical and retrapping current densities (Jc, Jr respectively) for all the nanowire widths, observing a peculiar behavior in SiO2 and SiN samples which needs further investigation. Optical response was characterized in terms of reset time (τ), dark count rate (DCR) and photon count rate (PCR) with a 1550 nm wavelength laser at 3K. Single photon regime was verified in all the measured detectors. Reset time has been confirmed to be limited by kinetic inductance Lk for all the substrates. DCR behavior appeared to be correlated to the difference in film properties. Only detector fabricated on SiN and SiO2 substrates showed saturation in the photon count rate, while the highest count rate was achieved by Al2O3 sample. The different behavior of photon counts response on the substrates suggests a correlation with the measured thermal conductance β and needs further study. Nevertheless, the comparison between the extracted thermal boundary conductances and the theoretical ones highlighted relevant discrepancies between theory and experimental data. In conclusion, devices fabricated on NbN deposited on different substrates showed a peculiar detector photo-response behavior. A deeper evaluation of NbN disorder grade and a better thermal characterization of the substrate-thin film interface are needed as future work.

•Oct 25, 2019•0 citations

AlN-Buffered Superconducting NbN Nanowire Single-Photon Detector on GaAs

Ekkehart Schmidt, K. Ilin, M. Siegel

We investigated the suitability of AlN as a buffer layer for NbN superconducting nanowire single-photon detectors (SNSPDs) on GaAs. The NbN films with a thickness of 3.3-20 nm deposited onto GaAs substrates with an AlN buffer layer demonstrate a higher critical temperature, critical current density, and lower residual resistivity in comparison to films deposited onto bare substrates. Unfortunately, the thermal coupling of the NbN film to the substrate weakens. SNSPDs made of 4.9-nm-thick NbN films on buffered substrates (in comparison to detectors made from NbN films on bare GaAs) demonstrate three orders of magnitude lower dark count rates and about ten times higher detection efficiency at 900 nm being measured at 90% of the critical current. The system timing jitter of SNSPDs on buffered substrates is 72 ps, which is 36 ps lower than those on bare substrate. However, a weaker thermal coupling of NbN nanowire to the buffered substrate leads to a latching effect at bias currents > 0.97 IC.

arXiv:1609.09694•IEEE Transactions on Applied Superconductivity•Dec 19, 2016•24 citations

Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors

Simone Ferrari, Vadim V. Kovalyuk, Wladislaw Hartmann +7 more

We investigate how the bias current affects the hot-spot relaxation dynamics in niobium nitride. We use for this purpose a near-infrared pump-probe technique on a waveguide-integrated superconducting nanowire single-photon detector driven in the two-photon regime. We observe a strong increase in the picosecond relaxation time for higher bias currents. A minimum relaxation time of (22 ± 1) ps is obtained when applying a bias current of 50% of the switching current at 1.7 K bath temperature. We also propose a practical approach to accurately estimate the photon detection regimes based on the reconstruction of the measured detector tomography at different bias currents and for different illumination conditions.

Optics Express•Apr 5, 2017•19 citations

Effect of buffer layer on thermal recovery of superconducting nanowire single-photon detector

T Xu, S. Chen, Hongkai Shi +7 more

Abstract Superconducting nanowire single-photon detectors (SNSPDs) wherein ultrathin films are fabricated on Si substrates are greatly affected by lattice mismatch between the thin film and the substrate. A buffer layer can be used to reduce such lattice mismatch or optimize the strain in the film, thereby improving device performance. We prepared and optimized Nb 5 N 6 as a buffer layer and found that it considerably improved the properties of NbN films on Si substrates. The zero-resistance critical temperature ( T C0 ) of a 3 nm thick NbN film with a 20 nm thick buffer layer was 10.3 K. SNSPDs with Nb 5 N 6 -buffered NbN films were fabricated and compared with normal devices; the fabricated devices had high hysteresis current and low timing jitter. Furthermore, we investigated the thermal diffusion process of the device based on the hysteresis current and hotspot relaxation time and found that Nb 5 N 6 buffer layers enhance the thermal coupling between the superconducting film and substrates. The relaxation time of buffered SNSPD was 14.2 ps, which was shorter than that of nonbuffered SNSPD by 17.8 ps. These effects explain the performance improvement observed in the case of the buffered devices.

Superconductor Science and Technology•May 11, 2021•12 citations

Nb5N6 Buffered Superconducting NbN Nanowire Single-Photon Detector on Si Substrate

Tao Xu, Xiaoqing Jia, Shi Chen +8 more

Superconducting nanowire single photon detectors (SNSPDs) based on Si substrates have demonstrated excellent performance, such as high efficiency, low dark count rate, short reset time and low timing jitter. But due to the lattice mismatch between NbN and Si substrate, the performance of film is limited. To this end, Nb5N6layer is fabricated as the buffer layer between the NbN film and Si substrate, and that will reduce the mismatch and optimize superconducting properties of NbN films. The 6nm-thick film with a 65 nm-thick buffer layer shows the zero resistance critical temperature (Tc0) of 13.27 K, which is 5 K higher than that without buffer. Based on the NbN film on the buffered substrate, we fabricated SNSPD devices demonstrate critical current (IC) of 65 μA which is 5 ~ 6 times higher to the detectors without buffer. Besides, the experiment results prove that the buffer layer reduces the kinetic inductance, which fasten the recovery of nanowire.

IEEE International Superconductive Electronics Conference (ISEC)•Jul 1, 2019•1 citation
Abstract Hotspot relaxation time (τ th ) is one of the essential parameter which defines the maximum count rate of superconducting nanowire single-photon detectors (SNSPDs). We studied the τ th for NbN-based SNSPDs on various substrates using the two-photon detection method based on the pump-probe spectroscopy technique. We observed that τ th strongly increased with increasing bias current in the two-photon detection regime. In addition, the minimum hotspot relaxation time (τ th )min was not significantly affected by the bath temperature; this is different from the previous observations reported for WSi SNSPDs. In addition, a strong dependency of (τ th )min on the substrate was found. The minimum (τ th )min was 11.6 ps for SNSPDs made of 5.5-nm-thick NbN on MgO (100), whereas the maximum (τ th )min was 34.5 ps for SNSPDs made of 7.5-nm-thick NbN on Si (100). We presented a direct correlation between the values of τ th and degrees of disorder of NbN films grown on different substrates.
The hotspot relaxation time (τth) was systematically studied on superconducting nanowire single-photon detectors (SNSPDs) made from ultrathin NbN films with different substrates and chemical compositions. The τth values were measured to be between 9.2 ps and 41.1 ps at the bath temperature of 2.15 K. The temperature dependence of τth ∝ TC−1.5 was observed, which indicated a dominant electron-phonon scattering relaxation mechanism in disordered NbN films. In addition, the increase in τth results in a higher latching probability in NbN-based SNSPDs with the same electrical response time (τe). The experimental results confirmed that the devices suffered latching when the ratio of the electric and thermal relaxation time was less than 133. This observation is an interesting reference for the design and process optimization of SNSPDs.
The hotspot dynamics is one of the key process involved in the detection mechanism in superconducting nanowires single photon detectors (SNSPDs). The energy delivered by the photon absorption creates a non-equilibrium region where Cooper pairs break into quasi-particles, which undergo a thermalization process involving hot-electron–phonon interactions within the superconducting film. Eventually, phonons dissipate the excess energy into the substrate and relax to the base temperature. Hence, intrinsic reset time, count rate and possibly other parameters are conceivably affected by thermal coupling between the substrates and the superconducting film. Thus, a detailed understanding of the thermal boundary conductance is crucial for achieving the best possible performances. Even though recent studies have demonstrated that the substrate plays an important role in defining the hotspot relaxation time, no systematic study on the influence on detector performance metrics has been carried out yet. In this work, we investigated the effect of different substrates on SNSPDs performance. Meandered detectors and single nanowires with various dimensions have been successfully fabricated on ultrathin NbN film sputtered on six substrates: SiO2, Al2O3, SiC, SiN, AlN and GaN. We characterized the deposited films measuring Tc, ρ, ΔTc and RRR. Lattice mismatch is known to play an important role in determining the resulting film quality. SiO2 and SiN samples, in which the mismatch is pronounced, showed lower Tc and higher ρ compared to the other substrates. We extracted the critical and retrapping current densities (Jc, Jr respectively) for all the nanowire widths, observing a peculiar behavior in SiO2 and SiN samples which needs further investigation. Optical response was characterized in terms of reset time (τ), dark count rate (DCR) and photon count rate (PCR) with a 1550 nm wavelength laser at 3K. Single photon regime was verified in all the measured detectors. Reset time has been confirmed to be limited by kinetic inductance Lk for all the substrates. DCR behavior appeared to be correlated to the difference in film properties. Only detector fabricated on SiN and SiO2 substrates showed saturation in the photon count rate, while the highest count rate was achieved by Al2O3 sample. The different behavior of photon counts response on the substrates suggests a correlation with the measured thermal conductance β and needs further study. Nevertheless, the comparison between the extracted thermal boundary conductances and the theoretical ones highlighted relevant discrepancies between theory and experimental data. In conclusion, devices fabricated on NbN deposited on different substrates showed a peculiar detector photo-response behavior. A deeper evaluation of NbN disorder grade and a better thermal characterization of the substrate-thin film interface are needed as future work.
We investigated the suitability of AlN as a buffer layer for NbN superconducting nanowire single-photon detectors (SNSPDs) on GaAs. The NbN films with a thickness of 3.3-20 nm deposited onto GaAs substrates with an AlN buffer layer demonstrate a higher critical temperature, critical current density, and lower residual resistivity in comparison to films deposited onto bare substrates. Unfortunately, the thermal coupling of the NbN film to the substrate weakens. SNSPDs made of 4.9-nm-thick NbN films on buffered substrates (in comparison to detectors made from NbN films on bare GaAs) demonstrate three orders of magnitude lower dark count rates and about ten times higher detection efficiency at 900 nm being measured at 90% of the critical current. The system timing jitter of SNSPDs on buffered substrates is 72 ps, which is 36 ps lower than those on bare substrate. However, a weaker thermal coupling of NbN nanowire to the buffered substrate leads to a latching effect at bias currents > 0.97 IC.
We investigate how the bias current affects the hot-spot relaxation dynamics in niobium nitride. We use for this purpose a near-infrared pump-probe technique on a waveguide-integrated superconducting nanowire single-photon detector driven in the two-photon regime. We observe a strong increase in the picosecond relaxation time for higher bias currents. A minimum relaxation time of (22 ± 1) ps is obtained when applying a bias current of 50% of the switching current at 1.7 K bath temperature. We also propose a practical approach to accurately estimate the photon detection regimes based on the reconstruction of the measured detector tomography at different bias currents and for different illumination conditions.
Abstract Superconducting nanowire single-photon detectors (SNSPDs) wherein ultrathin films are fabricated on Si substrates are greatly affected by lattice mismatch between the thin film and the substrate. A buffer layer can be used to reduce such lattice mismatch or optimize the strain in the film, thereby improving device performance. We prepared and optimized Nb 5 N 6 as a buffer layer and found that it considerably improved the properties of NbN films on Si substrates. The zero-resistance critical temperature ( T C0 ) of a 3 nm thick NbN film with a 20 nm thick buffer layer was 10.3 K. SNSPDs with Nb 5 N 6 -buffered NbN films were fabricated and compared with normal devices; the fabricated devices had high hysteresis current and low timing jitter. Furthermore, we investigated the thermal diffusion process of the device based on the hysteresis current and hotspot relaxation time and found that Nb 5 N 6 buffer layers enhance the thermal coupling between the superconducting film and substrates. The relaxation time of buffered SNSPD was 14.2 ps, which was shorter than that of nonbuffered SNSPD by 17.8 ps. These effects explain the performance improvement observed in the case of the buffered devices.
Superconducting nanowire single photon detectors (SNSPDs) based on Si substrates have demonstrated excellent performance, such as high efficiency, low dark count rate, short reset time and low timing jitter. But due to the lattice mismatch between NbN and Si substrate, the performance of film is limited. To this end, Nb5N6layer is fabricated as the buffer layer between the NbN film and Si substrate, and that will reduce the mismatch and optimize superconducting properties of NbN films. The 6nm-thick film with a 65 nm-thick buffer layer shows the zero resistance critical temperature (Tc0) of 13.27 K, which is 5 K higher than that without buffer. Based on the NbN film on the buffered substrate, we fabricated SNSPD devices demonstrate critical current (IC) of 65 μA which is 5 ~ 6 times higher to the detectors without buffer. Besides, the experiment results prove that the buffer layer reduces the kinetic inductance, which fasten the recovery of nanowire.