Russian Microelectronics
Statistical Models and Adequacy Validation for Optical Quantum State Tomography with Quadrature Measurements
Yu. I. Bogdanov, Nadezhda A. Bogdanova, L. V. Belinsky, Vladimir F. Lukichev
Abstract
Mutually complementary quadrature quantum measurements are analyzed and a new method to formulate statistical models of quantum states is proposed. The method is based on the root approach to quantum measurements and includes a procedure for approximating quantum states with reduced finite dimensional models. The efficiency of the proposed approach is demonstrated using numerical experiments. This approach is aimed at achieving the highest possible precision in multiphoton quantum state tomography.