Advanced electron microscopy technologies have made it possible to perform precise double-slit interference experiments. We used a 1.2-MV field emission electron microscope providing coherent electron waves and a direct detection camera system enabling single-electron detections at a sub-second exposure time. We developed a method to perform the interference experiment by using an asymmetric double-slit fabricated by a focused ion beam instrument and by operating the microscope under a "pre-Fraunhofer" condition, different from the Fraunhofer condition of conventional double-slit experiments. Here, pre-Fraunhofer condition means that each single-slit observation was performed under the Fraunhofer condition, while the double-slit observations were performed under the Fresnel condition. The interference experiments with each single slit and with the asymmetric double slit were carried out under two different electron dose conditions: high-dose for calculation of electron probability distribution and low-dose for each single electron distribution. Finally, we exemplified the distribution of single electrons by color-coding according to the above three types of experiments as a composite image.
Advanced electron microscopy technologies have made it possible to perform precise double-slit interference experiments. We used a 1.2-MV field emission electron microscope providing coherent electron waves and a direct detection camera system enabling single-electron detections at a sub-second exposure time. We developed a method to perform the interference experiment by using an asymmetric double-slit fabricated by a focused ion beam instrument and by operating the microscope under a "pre-Fraunhofer" condition, different from the Fraunhofer condition of conventional double-slit experiments. Here, pre-Fraunhofer condition means that each single-slit observation was performed under the Fraunhofer condition, while the double-slit observations were performed under the Fresnel condition. The interference experiments with each single slit and with the asymmetric double slit were carried out under two different electron dose conditions: high-dose for calculation of electron probability distribution and low-dose for each single electron distribution. Finally, we exemplified the distribution of single electrons by color-coding according to the above three types of experiments as a composite image.
Current nanotechnology techniques make possible the preparation of slits in the submicrometer range so that electron interference and diffraction experiments can be done even with a conventional electron microscope. If the instrument is also equipped with a field emission source, it is possible to follow almost in real time the transition from the image of the slits to their Fraunhofer pattern through the intermediate Fresnel diffraction images. We discuss our results for the two-slit experiment and illustrate them for the three-slit case.
Abstract In an electron double-slit experiment, an optically zero propagation distance condition (infocus imaging condition), in which the double-slit position was imaged just on the detector plane (image plane), was realized in a 1.2 MV field-emission transmission electron microscope. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we observed the interference features under the pre-interference condition, interference condition and post-interference condition of electron waves. We conclude that it is possible to observe the interference fringes only when the path information of the individual electrons is not available.
Electron double-slit experiments, the essence of quantum mechanical “wave/particle duality”, have been extensively and continuously studied because their unrealistic interpretations have attracted many researchers. Here, we discuss recent sophisticated V-shaped double-slit experiments to elucidate electron-path information, i.e., which slit electrons pass through, which path they pursue, and where they arrive and interfere on the image plane. In a transmission electron microscope, an optically zero-propagation distance condition was realized, where the double-slit position was imaged just on the detector plane. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we confirmed that it is possible to observe interference fringes only when the path information of individual electrons is not available. Furthermore, we studied how the interference fringes would shift their detected positions when electron wave phases were modulated before illumination to the double slit. Phase shifts were generated by tilting electron beams. We confirmed that each single electron as a wave changed its phase even when it traveled alone inside the microscope.
Electron double-slit experiments, the essence of quantum mechanical “wave/particle duality,” have been extensively and continuously studied because their unrealistic interpretations have attracted many researchers. Here, we discuss recent sophisticated V-shaped double-slit experiments to elucidate electron-path information, i.e., which slit electrons pass through, which path they pursue, and where they arrive and interfere on the image plane. In a transmission electron microscope, an optically zero-propagation distance condition was realized, where the double-slit position was imaged just on the detector plane. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we confirmed that it is possible to observe interference fringes only when the path information of individual electrons is not available. Furthermore, we studied how the interference fringes would shift their detected positions when electron wave phases were modulated before illumination to the double slit. Phase shifts were generated by tilting electron beams. We confirmed that each single electron as a wave changed its phase even when it traveled alone inside the microscope.
Abstract The paper presents the results of a quantum interference study using an asymmetrical double-slit experiment with a low-intensity laser beam, conducted in the single-photon approximation and the Fresnel near-field transition pre-Fraunhofer condition. In addition to the temporal separation achieved by recording each particle individually, the hybrid-asymmetrical double-slit design (in both width and height) also allows spatial separation of the first satellite diffraction bands created by each slit, thereby minimising the mixing background effects from the opposite slit. Isolating the satellite bands of a diffraction pattern from one of the two slits enables which-way identification of the quantum particle, contributing maximally to the path-distinguishability parameter D=1. Within these satellite bands, we observed interference fringes with reliability at their diffraction peaks for the wide slit and the narrow slit. After subtracting multiphoton-mixing interference noises V(mix), we obtain significant single-photon wave visibility values = 0.051±.009(stat.+sys.) and = 0.065±.009(stat.+sys.), respectively, at the wide-slit I1 and narrow-slit I2 diffraction bands. The results suggest the possibility of establishing an unusual correlation, D + V > 1, in which a significant number of photons exhibit both wave and particle properties simultaneously within the same experimental spectrum. This differs from the Copenhagen interpretation and therefore requires further explanation. PACS numbers: 03.65.-w, 03.65.Ta, 42.50.Xa
The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.