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Bulletin of the American Physical Society

TLS-like temperature and power dependence for loss in superconducting coplanar resonators

Sergey P. Gladchenko, M. J. A. Stoutimore, Moe S. Khalil, Kevin D. Osborn

Published Mar 18, 2013• 0 citations
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Measuring the internal quality factor of coplanar waveguide superconducting resonators is an established method of determining small losses in superconducting devices. Often, resonator losses are attributed to two-level system (TLS) defects using a power dependent model for the quality factor. However, excess non-equilibrium quasiparticles can also limit the quality factor of superconducting resonators. Here, a two-temperature, power and temperature dependent model is used to evaluate resonator losses for titanium nitride and aluminum coplanar waveguide resonators with loss tangents of 10−5–10−6. This model enables a set of parameters to describe both the internal quality factor and fractional frequency shift of the resonator across a broad range of average cavity photon numbers, from 1 to 106, and temperatures between those limited by the experimental apparatus near 50 mK and thermal quasiparticle dominated. The presented model also offers potential insight into observing the temperature and power dependence of TLS–TLS interactions in these resonators.
High quality factor, i.e. low loss, microwave resonators are important for quantum information storage and addressing. In this work we study the resonance frequency and loss in superconducting coplanar waveguide resonators as a function of power and temperature. We find that there is increased loss at low power and low temperature. The increased loss is attributed to the existence of two-level systems (TLS) at the surfaces, interfaces, and in the bulk of insulators deposited on the structures. We show that both the temperature dependence of the resonant frequency and the power dependence of the loss can be used to find the TLS contribution to the loss. The TLS intrinsic loss tangent derived from the frequency shift data at high power is shown to agree well with the direct loss measurement at low power. The former allows for a relatively fast measurement of the TLS loss. As an example, we measure the properties of amorphous AlOXdeposited on the resonators and find a TLS loss tangent of 1 × 10-3.
We investigated the loss mechanisms of superconducting circuits with epitaxially grown NbN(100) on MgO(100) substrates by measuring quarter-wave coplanar waveguide resonators with various strip and slot widths. The power dependence of the internal quality factor and the temperature dependence of the resonance frequency shift were evaluated in a dilution refrigerator. The measurement and analysis of the loss in these resonators indicate that the loss was dominated by a two-level system (TLS) loss and the TLS host materials were primarily distributed at the surface of the substrate.