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Springer theses

Time-Resolved Dynamics of Josephson Junctions

Joseph Weston

Published Jan 1, 2017• 0 citations
Publisher
DOI
10.1007/978-3-319-63691-7_6

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High-resolution (sub-microsecond to nanosecond) time-resolved measurements of the dynamics of superconducting electronic devices, such as Josephson tunnel junctions and SQUIDs, are indispensable for fundamental physics research, such as quantum mechanics of macroscopic variables. We describe the development of a time-resolved measurement technique that enables direct measurements, in the time domain, of the temporal evolution of Josephson junctions with a nanosecond resolution. The technique was applied to study escape dynamics of Josephson junctions, as macroscopic quantum systems, in the quantum tunnelling regime. The measured probability of junctions remaining in the initial metastable state—the survival probability—as a function of time decayed exponentially, agrees very well with the theoretical prediction of the incoherent tunnelling process.
We determined the dissipation-induced decoherence time (DIDT) of a superconducting Josephson tunnel junction by time-resolved measurements of its escape dynamics. Double-exponential behavior of the time-dependent escape probability was observed, suggesting the occurrence of a two-level decay-tunneling process in which energy relaxation from the excited to the ground level significantly affects the escape dynamics of the system. The observation of temporal double-exponential dependence enables direct measurements of the DIDT, a property critical to the study of quantum dynamics and the realization of macroscopic quantum coherence and quantum computing. We found that the DIDT was tau(d) > 11 micros at T = 0.55 K, demonstrating good prospects for implementing quantum computing with Josephson devices.