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Springer eBooks

Time Domain Analysis of Dynamical Switching in a Josephson Junction

Joachim Sjöstrand, T. H. Hansson, A. Karlhede, Jochen Walter, David B. Haviland

Published May 29, 2006• 2 citations
Publisher
DOI
10.1007/0-387-31143-2_7

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The switching dynamics of a double-barrier Josephson junction is analyzed as a function of the microscopic properties of its electrodes. In particular, it is found that the nonstationary behavior of the Josephson phase difference is very sensitive to dissipation mechanisms acting inside the intrinsic shunt. The leading factor that determines the dissipation is the local electron density of states N(E) inside the electrodes. The roles of junction geometry, electrode purity, and interface quality are discussed and how they affect the details of N(E), hence the resulting phase dynamics. The microscopic analyses allow optimization of the performance of double-barrier Josephson junction-based rapid-single-flux-quantum circuits in two ways: 1) decreasing the switching time of Josephson elements and 2) reducing the excess wiring. Such an analysis is facilitated with the aid of a lumped circuit representation which generalizes the nonlinear resistive-shunted-junction model.
We report on the fabrication of superconductor/insulator/ferromagnetic metal/superconductor (Nb/AlOx/PdNi/Nb) π-Josephson junctions. An analysis of Fiske modes up to about 400 GHz provides information on the junction quality factor and the relevant damping mechanisms. High quality factors of up to 30 around 200 GHz have been achieved. They allow for the study of the dynamic properties of the junctions, in particular the switching probability from the zero-voltage into the voltage state with and without microwave irradiation. The experiments with microwave irradiation are well explained within semi-classical models and numerical simulations. At mK temperature, the switching dynamics without applied microwaves clearly shows secondary quantum effects. Here, we could observe for the first time macroscopic quantum tunneling in Josephson junctions with ferromagnetic interlayer.