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Bulletin of the American Physical Society

Pulse Recycling and Weak Value Amplification for Precision Metrology

Trent Graham, Courtney L. Byard, Paul G. Kwiat, Andrew N. Jordan

Published Jun 12, 2015• 0 citations
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The weak-value-based metrology is very promising and has attracted a lot of attention in recent years because of its remarkable ability in signal amplification. However, it is suggested that the upper limit of the precision of this metrology cannot exceed that of classical metrology because of the low sample size caused by the probe loss during postselection. Nevertheless, a recent proposal shows that this probe loss can be reduced by the power-recycling technique, and thus enhance the precision of weak-value-based metrology. Here we experimentally realize the power-recycled interferometric weak-value-based beam-deflection measurement and obtain the amplitude of the detected signal and white noise by discrete Fourier transform. Our results show that the detected signal can be strengthened by power recycling, and the power-recycled weak-value-based signal-to-noise ratio can surpass the upper limit of the classical scheme, corresponding to the shot-noise limit. This work sheds light on higher precision metrology and explores the real advantage of the weak-value-based metrology over classical metrology.
We demonstrate the superior robustness of the transition regime in inverse weak-value amplification (IWVA) metrology against key experimental noise sources. For standard IWVA schemes, the transition regime provides enhanced resilience compared to the conventional IWVA regime when subjected to uncorrelated Gaussian technical noise and phase fluctuations. While a larger beam width σ generally suppresses technical noise, we identify that phase fluctuations impose a strict upper bound on the optimal σ . In power-recycled IWVA schemes, where cavity loss and the inherent walk-off effect typically degrade the signal, the transition regime maintains a consistent advantage. Our findings establish the transition regime as the optimal operational point for high-precision measurements, balancing significant signal amplification with robustness against practical noise in both standard and power-recycled configurations.