Continuous Weak Measurement of Qubit Oscillations with Strongly Responding Single Electron Transistors
HuJun Jiao, Shi-Kuan Wang, Feng Li, Xin-Qi Li
Abstract
We investigate the continuous weak measurement of a solid-state qubit by single electron transistors in nonlinear response regime. It is found that the signal-to-noise ratio can violate the universal upper bound imposed quantum mechanically to any linear response detectors. We understand the violation by means of the cross-correlation of the detector currents.