NASA Tech Briefs
Dual-Ion-Trap Frequency Standards With Overlapping Cycles
G.J. Dick, John D. Prestage
Abstract
Proposed scheme for enhancing performances of atomic frequency-standard apparatuses calls for two or more ion traps per apparatus interrogated in alternation by radio-frequency pulses. Provides nearly constant feedback gain, thereby providing nearly constant corrections for fluctuations in frequency of local oscillator. Degradation of performance by fluctuations in local oscillators reduced.