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International Conference on Solid State Devices and Materials (SSDM)

High-speed Operation of a Single-Flux-Quantum (SFQ) Cross/bar Switch up to 35 GHz

義男 亀田, Shinichi Yorozu, Hirotaka Terai, Akira Fumijaki

Published Sep 18, 2002• 0 citations
Publisher
DOI
10.7567/ssdm.2002.d-4-2

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Single-flux-quantum (SFQ) technology is a novel technology where binary information is represented by a single flux. It enables us to realize high-speed, low-power SFQ logic circuits, surpassing conventional complementary metal-oxide-silicon (CMOS) technology. We proposed an SFQ packet switch to avoid the bottlenecks in broadband networks of the future. To demonstrate high-speed operation of an SFQ logic circuit and its application to our switch architecture, we designed a cross/bar switch. It consists of 13 logic gates and 581 Josephson junctions were used in the layout. We confirmed correct operations up to 33 GHz in simulation. We placed the switch circuit in an on-chip test system for high-speed (over 10 GHz) test. Including I/O circuits, the system as a whole consists of 1236 Josephson junctions. The chip was fabricated by using NEC's standard Nb process. We carried out an on-chip test and found correct operations up to 35 GHz.
We have been developing a single-flux-quantum (SFQ) cross-bar switch, which is a main component of a network packet switch. We think that a network switch is an application in which the high speed of SFQ technology would be advantageous. Anticipating general and large-scale SFQ logic circuit design, we used the cell-based design method and the CONNECT standard SFQ cell library. The two-input and two-output cross-bar switch, a core switch component, consists of 13 logic cells connected by Josephson-transmission-line (JTL) cells. Because of the large size of JTL cells and the large delay in them, timing adjustment becomes more difficult as the operating speed and circuit size increase. After using a commercially available automatic router to find appropriate routes efficiently, we used a static timing analyzer for fine timing adjustment. Timing violations were fixed by changing JTL path delays using the tools we developed. The target operating frequency of the switch was 40 GHz, which corresponds to a clock period of 25 ps. Careful timing adjustment was necessary to ensure correct operations at such a high speed. The test chip was fabricated by using an NEC standard Nb process. The circuit, including on-chip test circuitry, was composed of about 1500 Josephson junctions. We confirmed its correct operations up to 50 GHz with a bias margin of /spl plusmn/20%.