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Acta Optica Sinica

Slow Light Phenomenon and Its Theory in Thin Film Media

吕毅 Lü Yi, 吴九汇 Wu Jiuhui, 李丽丽 Li Lili

Published Jan 1, 2013• 1 citation
Publisher
DOI
10.3788/aos201333.0831002

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The refraction of a short pulse by a thin film of atoms at two-photon resonance is numerically considered with the process of third harmonic generation involved in the analysis. It is shown that a light pulse, being refracted by a thin film of resonance atoms, decays into subpulses, whose number is determined by the energy penetrating the film. The process depends on the angle of incidence. The variation on the resonance detuning allows compensation of the Stark effect and creation of preferable conditions for light pulse transmission. The effect of local field is similar in its action to the Stark effect, but its contribution to the frequency shift could be significant only in media with a greater concentration of the resonance atoms.
A refraction of short pulses by a thin film of atoms at two- photon resonance is numerically considered with the process of third harmonic generation involved in analysis. It is shown that a light pulse, being refracted by a tin film of resonance atoms, decays into subpulses, which number is determined by the energy penetrated in the film. The process depends on the angle of incidence. The variation of the resonance detuning allows compensating Stark effect and creating the preferable conditions for light pulse transmission. The effect of local field is similar in its action to the Stark effect, but its contribution to the frequency shift could be significant only in the media with greater concentration of the resonance atoms.