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Conference on Precision Electromagnetic Measurements

Power-dependence measurement of the quality factor of superconducting microwave resonators at mK temperature

Seon Hoo Kim, Dong-Gwang Ha, Gwan Yeol Park, Jiman Choi, Jung Hwan Park, Woon Young Song, Soon-Gul Lee, Hyunsik Im, Hyungsang Kim, Yonuk Chong

Published Aug 1, 2014• 2 citations
Publisher

Abstract

We report our setup and measurement results of the quality factor Q of superconducting microwave resonators at mK temperature in a dilution refrigerator. The power dependence of the superconducting resonators' Q was measured down to the single photon level. Measurements were performed on two types of microwave resonators. First, a half-wavelength coplanar waveguide (CPW) resonator made of niobium film on an oxidized high-resistivity silicon substrate was measured. Then a rectangular box resonator made of machined superconducting aluminum alloy was measured. While the CPW chip resonator's Q value showed noticeable decrease at low microwave power, the box resonator's Q showed little power dependence. This setup is intended to perform characterization of various microwave resonators, which will serve as key components in superconducting qubit in circuit QED architecture.

DOI
10.1109/cpem.2014.6898315

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In this master's thesis, I present the design, fabrication, and characterisation of superconducting microwave resonators. These resonators are quarter-wavelength coplanar waveguide resonators, operating at resonance frequencies between 4 GHz and 8 GHz. This kind of resonator is a key component in several applications, ranging from quantum computation devices to parametric amplifiers. Minimising the losses (achieving high internal quality factors) in these resonators is important to maximise performance of the applications they are used for. During the thesis work, we have studied several possible changes to improve the resonator quality.\n\nFabrication of the resonators was done in the Nanofabrication Laboratory at Chalmers University of Technology, and consist of the following steps: cleaning a sapphire or silicon wafer, depositing a layer of superconducting niobium, photolithography, and etching the waveguide. We then measured the resonators in a cryogen-free dilution refrigerator, at a temperature of 10 mK. The measurements consisted of a power sweep, in order to quantify the quality factor at high and low excitation powers. As an example, the first resonator we fabricated had a quality factor of 4.3 x 10^4 at high power (about 10^5 photons in the resonator), and quality factor of 3.7 x 10^4 at the single-photon level.\n\nWe then investigated different loss mechanisms that we expect to negatively affect the quality factor, and how to reduce this loss. Firstly, to reduce radiation losses and magnetic vortex losses, we reduced the lateral dimensions of the resonator. Secondly, as two-level system (TLS) losses are believed to mainly reside at the surfaces of the materials and interfaces between them, we etched into the substrate to selectively move a part of the TLS away from the resonator. We also studied the effect of the meandering of the resonator on the quality factor, as well as using two different etching gasses.\n\nBy gathering all this data, we were then able to compare the different combinations to see the effect of the changing parameters. In conclusion, the reduced lateral dimensions and the removal of part of the substrate indeed reduce the losses, as expected from the theory. We also found interesting behaviour with regards to the meandering, namely that having a meandered structure negatively affects the quality factor.\n\nCombining all results, we can give a guideline for the fabrication of resonators in the future, which gave us a quality factor up to 4.9 x 10^5 at high excitation power, and 3.0 x 10^5 at the single photon level.

•Jan 1, 2016•0 citations
We report our setup and measurement results of the quality factor Q of superconducting microwave resonators at mK temperature in a dilution refrigerator. The power dependence of the superconducting resonators' Q was measured down to the single photon level. Measurements were performed on two types of microwave resonators. First, a half-wavelength coplanar waveguide (CPW) resonator made of niobium film on an oxidized high-resistivity silicon substrate was measured. Then a rectangular box resonator made of machined superconducting aluminum alloy was measured. While the CPW chip resonator's Q value showed noticeable decrease at low microwave power, the box resonator's Q showed little power dependence. This setup is intended to perform characterization of various microwave resonators, which will serve as key components in superconducting qubit in circuit QED architecture.
We report our development on design, fabrication and characterization of various superconducting resonators for quantum device applications. The resonators are developed mainly for superconducting qubit implementation in circuit QED structure, but future application will include photon detectors such as microwave kinetic inductance detectors. First we designed and fabricated half-wavelength coplanar waveguide resonators with niobium thin film on a high resistive silicon wafer, with the fundamental frequencies in the range of 1 to 8 GHz. The loaded quality factors are controlled by the coupling capacitors, and the lower bound of the intrinsic quality factor was measured down to 7 mK in the dilution refrigerator. We have also designed quarter-wavelength resonators and lumped LC resonators coupled to a transmission line, and characterized multiple resonators in a single transmission line. For the 3D transmon qubit application, we designed and fabricated a rectangular box resonator with superconducting aluminum. The intrinsic quality factor of the box resonator exceeds three million at 7 mK. We will also present basic results on the integration of a transmon qubit in the superconducting resonator.
The loss in superconducting microwave resonators at low-photon numbers and low temperatures is not well understood but has implications for achievable coherence times in superconducting qubits. We have fabricated single-layer resonators with a high quality factor by patterning a superconducting aluminum film on a sapphire substrate. Four resonator geometries were studied with resonant frequencies ranging from 5 to 7 GHz: a quasi-lumped element resonator, a coplanar strip waveguide resonator, and two hybrid designs that contain both a coplanar strip and a quasi-lumped element. Transmitted power measurements were taken at 30 mK as a function of frequency and probe power. We find that the resonator loss, expressed as the inverse of the internal quality factor, decreases slowly over four decades of photon number in a manner not merely explained by loss from a conventional uniform spatial distribution of two-level systems in an oxide layer on the superconducting surfaces of the resonator.
We successfully designed and fabricated an absorption-type of superconducting coplanar waveguide (CPW) resonators. The resonators are made from a niobium film (about 160 nm thick) on a high-resistance Si substrate, and each resonator is fabricated as a meandered quarter-wavelength transmission line (one end is short to the ground and another end is capacitively coupled to a through feedline). With a vector network analyzer we measured the transmissions of the applied microwave through the resonators at ultra-low temperature. The obtained loaded quality factors are significantly high, i.e. up to ∼10 6 . When the temperature increases slowly from the base temperature (20 mK), the resonance frequencies of the resonators are blue shifted and the quality factors are lowered slightly. In principle, this type of device can integrate a series of CPW resonators with a common feedline, making it a promising candidate as the data bus for coupling distant solid-state qubits and the sensitive detector of single photons.
The high critical magnetic field and relatively high critical temperature of niobium nitride (NbN) make it a promising material for applications in superconducting quantum technology. However, NbN-based superconducting circuits are sensitive to decoherence sources such as two-level system (TLS) defects. Here, we numerically and experimentally investigate NbN superconducting microwave coplanar waveguide resonator arrays with a 100 nm thickness, capacitively coupled to a common coplanar waveguide on a silicon chip. We observe that the resonators' internal quality factor (QiQ_{i}Qi​) decreases fromQi∼1.07×106Q_{i}\sim 1.07\times 10^{6}Qi​∼1.07×106in a high power regime toQi∼1.36×105Q_{i}\sim 1.36\times 10^{5}Qi​∼1.36×105in the single photon regime. Data from this study is consistent with the TLS theory, which describes the TLS interactions in resonator substrates and interfaces. Moreover, we study the temperature (TTT) dependence ofQiQ_{i}Qi​and resonance frequencyfrf_{r}fr​of coplanar waveguide resonators to characterize the quasiparticle density. We observe that the increase in kinetic inductance at higher temperatures is the main reason for the frequency shift. Finally, we measurefrf_{r}fr​andQiQ_{i}Qi​in response to in-plane magnetic fields (B∣∣B_{||}B∣∣​). We verify thatQiQ_{i}Qi​stays well above10410^{4}104up toB∣∣B_{||}B∣∣​= 240 mT in the photon number< ⁣nph ⁣>< \! n_{ph} \! ><nph​>= 1.8 atTTT= 100 mK. Our results could enable the development of robust microwave superconducting circuits for circuit quantum electrodynamics at high magnetic fields required for hybrid superconducting-semiconducting quantum circuits.
The high critical magnetic field and relatively high critical temperature of niobium nitride (NbN) make it a promising material candidate for applications in superconducting quantum technology. However, NbN-based devices and circuits are sensitive to decoherence sources such as two-level system (TLS) defects. Here, we numerically and experimentally investigate NbN superconducting microwave coplanar waveguide resonator arrays, with a 100 nm thickness, capacitively coupled to a common coplanar waveguide on a silicon chip. We observe that the resonators' internal quality factor (Qi) decreases from Qi ~ 1.07*10^6 in a high power regime (< nph > = 27000) to Qi ~ 1.36 *10^5 in single photon regime at temperature T = 100 mK. Data from this study is consistent with the TLS theory, which describes the TLS interactions in resonator substrates and interfaces. Moreover, we study the temperature dependence internal quality factor and frequency tuning of the coplanar waveguide resonators to characterise the quasiparticle density of NbN. We observe that the increase in kinetic inductance at higher temperatures is the main reason for the frequency shift. Finally, we measure the resonators' resonance frequency and internal quality factor at single photon regime in response to in-plane magnetic fields B||. We verify that Qi stays well above 10^4 up to B|| = 240 mT in the photon number < nph > = 1.8 at T = 100 mK. Our results may pave the way for realising robust microwave superconducting circuits for circuit quantum electrodynamics (cQED) at high magnetic fields necessary for fault-tolerant quantum computing, and ultrasensitive quantum sensing.
In this master's thesis, I present the design, fabrication, and characterisation of superconducting microwave resonators. These resonators are quarter-wavelength coplanar waveguide resonators, operating at resonance frequencies between 4 GHz and 8 GHz. This kind of resonator is a key component in several applications, ranging from quantum computation devices to parametric amplifiers. Minimising the losses (achieving high internal quality factors) in these resonators is important to maximise performance of the applications they are used for. During the thesis work, we have studied several possible changes to improve the resonator quality.\n\nFabrication of the resonators was done in the Nanofabrication Laboratory at Chalmers University of Technology, and consist of the following steps: cleaning a sapphire or silicon wafer, depositing a layer of superconducting niobium, photolithography, and etching the waveguide. We then measured the resonators in a cryogen-free dilution refrigerator, at a temperature of 10 mK. The measurements consisted of a power sweep, in order to quantify the quality factor at high and low excitation powers. As an example, the first resonator we fabricated had a quality factor of 4.3 x 10^4 at high power (about 10^5 photons in the resonator), and quality factor of 3.7 x 10^4 at the single-photon level.\n\nWe then investigated different loss mechanisms that we expect to negatively affect the quality factor, and how to reduce this loss. Firstly, to reduce radiation losses and magnetic vortex losses, we reduced the lateral dimensions of the resonator. Secondly, as two-level system (TLS) losses are believed to mainly reside at the surfaces of the materials and interfaces between them, we etched into the substrate to selectively move a part of the TLS away from the resonator. We also studied the effect of the meandering of the resonator on the quality factor, as well as using two different etching gasses.\n\nBy gathering all this data, we were then able to compare the different combinations to see the effect of the changing parameters. In conclusion, the reduced lateral dimensions and the removal of part of the substrate indeed reduce the losses, as expected from the theory. We also found interesting behaviour with regards to the meandering, namely that having a meandered structure negatively affects the quality factor.\n\nCombining all results, we can give a guideline for the fabrication of resonators in the future, which gave us a quality factor up to 4.9 x 10^5 at high excitation power, and 3.0 x 10^5 at the single photon level.