Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Atom-based RF electric field metrology above 100 GHz
Matthew T. Simons, Joshua A. Gordon, Christopher L. Holloway
Abstract
Atom-based radio-frequency (RF) electric field probes have the potential to improve electric field measurements for a broad range of frequencies (from a few GHz to 100s of GHz) and field strengths (mV/m to kV/m). For these probes to become a common measurement method, their range must be extended to high frequency (>100 GHz) and low field strength regimes. We present SI-traceable electric field measurements of RF fields above 100 GHz, using Autler-Townes splitting of Rydberg electromagnetically-induced transparency in a rubidium (Rb) vapor. We also demonstrate several techniques, including RF detuning from resonance and enhanced absorption, for increasing the probe sensitivity.