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Bulletin of the American Physical Society

Photon statistics of shot noise measured using a Josephson parametric amplifier

Jean Olivier Simoneau, Stéphane Virally, Christian Lupien, Bertrand Reulet

Published Mar 3, 2015• 0 citations
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Parametric amplifiers have become a workhorse in superconducting quantum computing; however, research and development of these devices has been hampered by inconsistent and, sometimes, misleading noise performance characterization methodologies. The concepts behind noise characterization are deceptively simple, and there are many places where one can make mistakes, either in measurement or in interpretation and analysis. In this article, we cover the basics of noise performance characterization and the special problems it presents in parametric amplifiers with limited power handling capability. We illustrate the issues with three specific examples: a high-electron mobility transistor amplifier, a Josephson traveling-wave parametric amplifier, and a Josephson parametric amplifier. We emphasize the use of a 50-Ω shot noise tunnel junction (SNTJ) as a broadband noise source, demonstrating its utility for cryogenic amplifier amplifications. These practical examples highlight the role of loss as well as the additional parametric amplifier "idler" input mode.

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We report a fabrication process and characterization of the Josephson parametric amplifier (JPA) for the single-shot quantum state measurement of superconducting multiqubit system. The device is prepared using Nb film as its base layer, which is convenient in the sample patterning process like e-beam lithography and film etching. Our results show that the JPA has a bandwidth up to 600 MHz with gain above 15 dB and noise temperature approaching the quantum limit. The qubit state differentiation measurements demonstrate the signal-to-noise ratio around 3 and the readout fidelity above 97% and 91% for the ground and first-excited states, respectively.
We present a method for the measurement of the noise of microwave amplifiers operating at the single photon level. It is based on the shot noise produced by a nanowire resistor in the hot electron regime. This noise source is simply controlled by a dc current and offers the advantage of being self-calibrating. After testing the noise source with a cryogenic high electron mobility transistor amplifier, we demonstrate its usefulness by calibrating a Josephson parametric amplifier operating near the quantum limit.
Parametric amplifiers have become a workhorse in superconducting quantum computing; however, research and development of these devices has been hampered by inconsistent and, sometimes, misleading noise performance characterization methodologies. The concepts behind noise characterization are deceptively simple, and there are many places where one can make mistakes, either in measurement or in interpretation and analysis. In this article, we cover the basics of noise performance characterization and the special problems it presents in parametric amplifiers with limited power handling capability. We illustrate the issues with three specific examples: a high-electron mobility transistor amplifier, a Josephson traveling-wave parametric amplifier, and a Josephson parametric amplifier. We emphasize the use of a 50-Ω shot noise tunnel junction (SNTJ) as a broadband noise source, demonstrating its utility for cryogenic amplifier amplifications. These practical examples highlight the role of loss as well as the additional parametric amplifier "idler" input mode.