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International Journal of Nano and Biomaterials

Simulation of effect of microwave irradiation on I-V characteristics of Josephson junction using RCLSJ model with noise into consideration

Mohammed Shahabuddin

Published Jan 1, 2009• 0 citations
Publisher

Abstract

I-V characteristics of Josephson junction (JJ) under microwave irradiation is simulated taking the resistance, capacitance and inductance of the junction (RCLSJ) into account. Since most of the JJ made with high TC material operates at high temperature where the thermal fluctuation is playing significant role. In the present simulation, thermal noise is also taken into consideration and simulated result explains the rounding behaviour of the Shapiro step observed in the experimental I-V curve. The simulated results also confirm the growing of Shapiro steps with increasing microwave power. This model also clearly account for the appearance of broad minima and reduction of the maxima in the power dependence of the step amplitude ΔIn/2Ic as observed in the experimental data of Kautz et al. (1992).

DOI
10.1504/ijnbm.2009.027729

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I-V characteristics of Josephson junction (JJ) under microwave irradiation is simulated taking the resistance, capacitance and inductance of the junction (RCLSJ) into account. Since most of the JJ made with high TC material operates at high temperature where the thermal fluctuation is playing significant role. In the present simulation, thermal noise is also taken into consideration and simulated result explains the rounding behaviour of the Shapiro step observed in the experimental I-V curve. The simulated results also confirm the growing of Shapiro steps with increasing microwave power. This model also clearly account for the appearance of broad minima and reduction of the maxima in the power dependence of the step amplitude ΔIn/2Ic as observed in the experimental data of Kautz et al. (1992).
Noise studies of both the dc and ac Josephson effects have been performed on a high-Tc ramp-type Josephson junction irradiated at 176 GHz. Well-established analytical results for noise in overdamped RSJs are used to model the measured I-V characteristics, and their agreement is excellent. Noise-rounded I-V curves at the critical current and the first and second Shapiro steps under coherent 176 GHz radiation have been studied in detail at several temperatures and rf power levels. The noise temperatures inferred from these simulations are close to the physical temperatures. An increase of noise temperatures at high radiation power levels is a result of radiation heating, which could be due to a bolometric effect.
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