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IEEE Transactions on Applied Superconductivity

Study of the IF bandwidth of NbN HEB mixers based on crystalline quartz substrate with an MgO buffer layer

Denis Meledin, Edward Tong, R. Blundell, N. Kaurova, Смирнов Константин Владимирович, B. Voronov, G. N. Gol'Tsman

Published Jun 1, 2003• 29 citations
Publisher

Abstract

In this paper, we present the results of IF bandwidth measurements on 3-4 nm thick NbN hot electron bolometer waveguide mixers, which have been fabricated on a 200-nm thick MgO buffer layer deposited on a crystalline quartz substrate. The 3-dB IF bandwidth, measured at an LO frequency of 0.81 THz, is 3.7 GHz at the optimal bias point for low noise receiver operation. We have also made measurements of the IF dynamic impedance, which allow us to evaluate the intrinsic electron temperature relaxation time and self-heating parameters at different bias conditions.

DOI
10.1109/tasc.2003.813671

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Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE•Mar 25, 2005•11 citations
In this paper, we present the results of IF bandwidth measurements on 3-4 nm thick NbN hot electron bolometer waveguide mixers, which have been fabricated on a 200-nm thick MgO buffer layer deposited on a crystalline quartz substrate. The 3-dB IF bandwidth, measured at an LO frequency of 0.81 THz, is 3.7 GHz at the optimal bias point for low noise receiver operation. We have also made measurements of the IF dynamic impedance, which allow us to evaluate the intrinsic electron temperature relaxation time and self-heating parameters at different bias conditions.
We have developed and characterized waveguide phonon-cooled NbN Hot Electron Bolometer (FMB) mixers fabricated from a 3-4 nrn thick NbN film deposited on a 200nm thick MgO buffer layer over crystalline quartz. Double side band receiver noise temperatures of 900-1050 K at 1.035 THz, and 1300-1400 K at 1.26 THz have been measured at an intermediate frequency of 1.5 GHz. The intermediate frequency bandwidth, measured at 0.8 THz LO frequency, is 3.2 GHz at the optimal bias point for low noise receiver operation.
We present recent measurements of receiver noise temperature and intermediate frequency (IF) bandwidth in the frequency range 0.8-1.3 THz for waveguide NbTiN HEB mixers of various dimensions. These devices are fabricated from an NbTiN film deposited on crystalline quartz substrates with AlN buffer layer. The lengths of the mixer elements vary from 0.3 to 0.5 /spl mu/m and their widths vary from 3 to 10 /spl mu/m. Critical temperatures are typically at 8.5 K, and the measured normal state resistance of the devices is about 1000 ohms per square. All the device DC parameters demonstrate a high degree of uniformity. A double side band noise temperature at 0.8 THz as low as 550 K has been measured at an IF frequency of 1.8 GHz, with a conversion loss of around 14 dB. At an IF of 3 GHz, the noise temperature increases to 750 K. We have also made extensive measurements of the IF bandwidth as a function of bias voltages and currents. At the optimal low-noise operation point, a 3-dB IF bandwidth of 1.2 GHz is obtained for a wide variety of device dimensions and bath temperature.
We have developed a new experimental setup for measuring the IF bandwidth of superconducting hot electron bolometer mixers. In our measurement system we use a chopped hot filament as a broadband signal source, and can perform a high-speed IF scan with no loss of accuracy when compared to coherent methods. Using this technique we have measured the 3 dB IF bandwidth of hot electron bolometer mixers, designed for THz frequency operation, and made from 3-4 nm thick NbN film deposited on an MgO buffer layer over crystalline quartz.
We present recently obtained values for gain bandwidth of NbN HEB mixers for different substrates and film thicknesses and for MgO buffer layer on Si at LO frequency of 0.85-1 THz. The maximal bandwidth, 5.2 GHz, was achieved for the device on MgO buffer layer on Si with a 2 nm thick NbN film. Functional devices based on NbN films of such thickness were fabricated for the first time due to an improvement of superconducting properties of NbN film deposited on MgO buffer layer on Si substrate. Introduction. In the last years, the development of HEB mixers has reached such a high level that these devices can be successfully utilized in heterodyne receivers of THz frequency range. Their high sensitivity and low LO power make them suitable for radioastronomic observations on space- and airbom platforms. An NbN HEB mixer seems to be a
We report the fabrication and testing of hot electron bolometric mixers with an ultrathin NbN film as heterodyne receivers operating at terahertz frequencies. We found that the quality of the NbN strip is usually degraded by damage resulting from the fabrication process, and we developed a process for reducing such damage. We also fabricated HEB mixers with a new structure in order to study the IF bandwidth determined by the original quality of the NbN thin films. Investigations at 100 GHz revealed that the widest IF bandwidth of 2.0 GHz was obtained by a mixer based on a 2.8 nm-thick NbN film. An HEB mixer based on the 2.8 nm-thick NbN film was also fabricated and evaluated. The receiver noise temperature at 900 GHz was 780 K, the absorbed LO power was about 400 nW, and the conversion gain was -13 dB.
We present the results of our studies of NbN phonon-cooled HEB mixers at terahertz frequencies. The mixers were fabricated from NbN film deposited on a high-resistivity Si substrate with an MgO buffer layer. The mixer element was integrated with a log-periodic spiral antenna. The noise temperature measurements were performed at 2.5 THz and at 3.8 THz local oscillator frequencies for the 3 x 0.2 μm2 active area devices. The best uncorrected receiver noise temperatures found for these frequencies are 1300 K and 3100 K, respectively. A water vapour discharge laser was used as the LO source. The largest gain bandwidth of 5.2 GHz was achieved for a mixer based on 2 nm thick NbN film deposited on MgO layer over Si substrate. The gain bandwidth of the mixer based on 3.5 nm NbN film deposited on Si with MgO is 4.2 GHz and the noise bandwidth for the same device amounts to 5 GHz. We also present the results of our research into decrease of the direct detection contribution to the measured Y-factor and a possible error of noise temperature calculation. The use of a square nickel cell mesh as an IR-filter enabled us to avoid the effect of direct detection and measure apparent value of the noise temperature which was 16% less than that obtained using conventional black polyethylene IR-filter.