The radio-frequency superconducting single electron transistor (RF-SET) is a highly sensitive and fast electrometer operating near the quantum limit. The back-action current noise of the SET induces voltage fluctuations on the system it is coupled to, dephasing its charge states. Here we propose to study the back action of the RF-SET by means of a double quantum dot (DQD) and, an RF-SET electrostatically coupled to one of the two dots. The inelastic current through the DQD is very sensitive to the spectral density of the voltage fluctuations in the nearby environment. By properly choosing the dot size and inter-dot tunnel barrier thickness, one can cause inelastic process to dominate the transport processes. A measurement of the inelastic current through the double dot system can then be used to calculate the spectral density of noise associated with the RF-SET and hence its back action. The design, fabrication and characterization of an RF-SET/DQD system is discussed in this work. Real-time studies of electron dynamics in coupled dots are also addressed.
We describe time-dependent single-electron transport through quantum dots in the Coulomb blockade regime. Coherent dynamics of a single charge qubit in a double quantum dot is discussed with full one-qubit manipulation. Strength of decoherence is controlled with the applied voltage, but uncontrolled decoherence arises from electron–phonon coupling and background fluctuations. Then energy-relaxation dynamics is discussed for orbital and spin degree of freedom in a quantum dot. The electron–phonon interaction and spin–orbit coupling can be investigated as the dissipation problem. Finally, charge detection measurement is presented for statistical analysis of single-electron tunnelling transitions and for a sensitive qubit read-out device.
The spin of an electron confined in semiconductor quantum dots is currently a promising candidate for quantum bit (qubit) implementations. Taking advantage of the existing CMOS integration technologies, such devices can offer a platform for large scale quantum computation. However, a quantum mechanical framework bridging a device's physical design and operational parameters to the qubit's energy space is lacking. Furthermore, the spin to charge coupling introduced by intrinsic or induced spin-orbit interaction (SOI) exposes the qubits to charge noise compromising their coherence properties and inducing quantum gate errors. We present here a comodeling framework for double quantum dot (DQD) devices and their charge noise environments. We use a combination of an electrostatic potential solver, full configuration interaction quantum mechanical methods, and two-level-fluctuator models to study the quantum gate performance in realistic device designs and operation conditions. We utilize the developed models together alongside the single electron solutions of the quantum dots to simulate one- and two-qubit gates in the presence of charge noise. We find an inverse correlation between quantum gate errors and quantum dot confinement frequencies. We calculate X-gate fidelities
>97 in the simulated Si-MOS devices at a typical TLF density of ${10}^{11}\phantom{\rule{4pt}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}$. We also find that exchange driven two-qubit SWAP gates show higher sensitivity to charge noise with fidelities down to
91 in the presence of the same density of TLFs. We further investigate the one- and two-qubit gate fidelities at different TLF densities. We find that given the small size of the quantum dots, sensitivity of a quantum gate to the distance between the noise sources and the quantum dot creates a strong variability in the quantum gate fidelities, which can compromise the device yields in scaled qubit technologies.