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MRS Proceedings

Enhanced Photoluminescence from Erbium-Doped Gap Microdisk Resonator

D. Y. Chu, X. Z. Wang, Wengang Bi, Rolando P. Espindola, Shengli Wu, Bruce W. Wessels, Charles W. Tu, Seng‐Tiong Ho

Published Jan 1, 1995• 0 citations
Publisher
DOI
10.1557/proc-392-229

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We report experimental results from an erbium-doped gallium phosphide microdisk resonator pumped by a Ti-sapphire laser at 980 nm. Fabrication and characterization of the microdisk resonator are discussed. Enhanced Er+3 intra-4f-shell photoluminescence was observed in the microdisk resonator due to microcavity effect and compared to a thin film sample. At low pumping power intensity, the photoluminescence from erbium-doped gallium phosphide microdisks is an order stronger than that from a thin film sample.
Erbium-doped TiO2 materials are promising candidates for advancing quantum technologies, necessitating a thorough understanding of their electronic and crystal structures to tailor their properties and enhance coherence times. This study explored epitaxial erbium-doped rutile TiO2 films deposited on r-sapphire substrates using molecular beam epitaxy. Photoluminescence excitation spectroscopy demonstrated decreasing photoluminescence lifetimes with erbium doping, indicating limited optical coherence times. Lattice distortions associated with Er3+ were probed by x-ray absorption spectroscopy, indicating that erbium primarily occupies Ti4+ sites and influences oxygen vacancies. Significant lattice distortions in the higher-order shells and apparent full coordination around erbium suggest that additional defects are likely prevalent in these regions. These findings indicate that defects contribute to limited coherence times by introducing alternative decay pathways, leading to shorter photoluminescence lifetimes.