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IEEE Transactions on Applied Superconductivity

RSFQ 1024-bit shift register for acquisition memory

Oleg A. Mukhanov

Published Jan 1, 1993• 73 citations
Publisher

Abstract

Rapid single flux quantum (RSFQ) 512-bit and 1024-bit shift registers have been demonstrated. These are the longest superconducting shift registers reported to date, employing 1045 and 2069 Josephson junctions, respectively. The circuit functionality has been confirmed with dc bias margins of +or-23% and +or-14% for the 512-bit and the 1024-bit shift registers, respectively. The 512-bit shift register has been tested to 20 GHz and 1024-bit register to 19 GHz using an external clock trigger with relative delay measurements at single and double SFQ clock frequencies. The shift registers with the same design have been used for successful implementation of the acquisition shift register (ASR) memory for the projected transient digitizer. These shift registers have the ability to acquire data at high speeds (gigahertz range), statically hold the acquired data, and then read-out the data into conventional room-temperature electronics at low speeds (megahertz range). A 32-bit ASR has been tested up to 18 GHz (the limit of our test setup), and a 1024-bit ASR-up to 16 GHz of acquisition rates, both at 33 MHz read-out frequency. Total power dissipation is about 1 mW for the 1024-bit circuit. The chips are fabricated using Hypres' Nb/AlO/sub x//Nb process with a junction critical current density of 1.0 kA/cm/sup 2/.>

DOI
10.1109/77.251810

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IEEE Transactions on Applied Superconductivity•Mar 1, 1993•79 citations
Rapid single flux quantum (RSFQ) 512-bit and 1024-bit shift registers have been demonstrated. These are the longest superconducting shift registers reported to date, employing 1045 and 2069 Josephson junctions, respectively. The circuit functionality has been confirmed with dc bias margins of +or-23% and +or-14% for the 512-bit and the 1024-bit shift registers, respectively. The 512-bit shift register has been tested to 20 GHz and 1024-bit register to 19 GHz using an external clock trigger with relative delay measurements at single and double SFQ clock frequencies. The shift registers with the same design have been used for successful implementation of the acquisition shift register (ASR) memory for the projected transient digitizer. These shift registers have the ability to acquire data at high speeds (gigahertz range), statically hold the acquired data, and then read-out the data into conventional room-temperature electronics at low speeds (megahertz range). A 32-bit ASR has been tested up to 18 GHz (the limit of our test setup), and a 1024-bit ASR-up to 16 GHz of acquisition rates, both at 33 MHz read-out frequency. Total power dissipation is about 1 mW for the 1024-bit circuit. The chips are fabricated using Hypres' Nb/AlO/sub x//Nb process with a junction critical current density of 1.0 kA/cm/sup 2/.>
Experimental superconducting shift registers consisting of on-chip clock generators, clock regeneration and distribution circuits, shift register elements, and readout circuits are designed using rapid single flux quantum logic/memory (RSFQ) gates. A 7-b shift register has been tested to 12 GHz and a 17-b to 21 GHz using external triggering clocks with relative delay measurements. Testing with internal clocks generated from Josephson oscillations shows a potential high-speed operation of 45 GHz for the 7-b and 30 GHz for the 17-b shift registers. Two types of magnetically coupled readout gates are discussed. The chips are fabricated using a Nb/AlO/sub /x/Nb Josephson-junction process at a critical-current density of 1000 A/cm/sup 2/. The power dissipation per bit is 3 mu W.>
Experimental superconducting shift registers con- sisting of on-chip clock generators, clock regeneration and dis- tribution circuits, shift register elements, and readout circuits are designed using rapid single flux quantum logic / memory (RSFQ) gates. A 7-b shift register has been tested to 12 GHz and a 17-b to 21 GHz using external triggering clocks with relative delay measurements. Testing with internal clocks generated from Josephson oscillations shows a potential high-speed opera- tion of 45 GHz for the 7-b and 30 GHz for the 17-b shift registers. Two types of magnetically coupled readout gates are discussed. The chips are fabricated using a Nb/AIO,/Nb Josephson-junction process at a critical-current density of 1000 A / cm2. The power dissipation per bit is 3 p.W.
Error rates of rapid-single-flux-quantum (RSFQ) shift register memories were investigated using a high-speed error-rate measurement system in order to demonstrate their reliability and stability. We designed and implemented an 8 times 8-bit shift register memory using the CONNECT cell library and the SRL 2.5 kA/cm2Nb process. The total number of Josephson junctions including the test system is 4184, and the circuit area is 2.1 mm times 3.2 mm. We measured the error rates of every storage node by reading out the data 216times at the clock frequency of 16 GHz. The measured error rates were lower than 10-10with DC bias margin better than plusmn5%.
Testing on a single-flux-quantum (SFQ) shift register fabricated with a SFQ Nb-AlO/sub x/Nb Josephson junction process indicates that a stable flux quantum can be stored in a rapid SFQ (RSFQ) shift register stage and be shifted by SFQ pulses. Design simulations showed that logic errors can occur in SFQ shift registers even though the circuit passes the average voltage test. Three-junction-per-stage shift registers had an advantage over the two-junction-per-stage shift register in handling data with successive 1's and in incorporating resistors to increase tolerance of trapped magnetic flux. Input and output buffers for data and clock pulses were added to get an RSFQ shift register to obtain correct performance. The highest error-free operation speed for the data with successive 1's is about half of the speed for propagation of a lone data 1. Error-free operation of SFQ shift registers with three junctions per stage could be obtained up to speeds of 30-60 GHz with Josephson junctions having I/sub c/R/sub n/ (critical-current-normal-resistance product) values of 600 mu V.>
In the realization of large-scale single-flux-quantum (SFQ) digital systems, one of the most serious problems is the lack of high-density and high-speed memories. We have been developing random access memories using SFQ shift registers, which are one candidate to solve the memory problem in the SFQ digital system because of their high throughput and short access time. In this paper we have designed and tested a (4 × 8)-bit SFQ shift register file as a demonstration of the SFQ shift register memory system. Its target clock frequency is 20 GHz assuming an NEC 2.5 kA cm −2 Nb standard process. In the test, we have confirmed that 8-bit dual-rail data can be loaded to appropriate shift registers specified by 2-bit address data. We have also verified that the loaded data are read out and written back to the same shift register at high speed. A tested dc bias margin at 20 GHz is ±5%.
The author presents the design and test results for a novel, buffered RSFQ shift register. The register design makes it possible to build a circular 64-b shift register which is insensitive to the clock pulse direction within the experimentally measured DC bias margin of +or-15%. The implementation of a large variety of unidirectional shift registers using either a buffered or a two-Josephson-junction cell design confirms an expected wide DC bias margin of +or-30% (for a 32-b) and high speed, up to 60 GHz (for a 4-b register). Among these circuits is a 256-b shift register. To the author's knowledge, this is the largest RSFQ circuit (533 junctions) reported to date. This shift register was tested to have a DC bias margin of +or-6% and proper high-speed operation up to 12 GHz.>