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IEEE Transactions on Applied Superconductivity

Investigation of Low-Frequency Excess Flux Noise in DC SQUIDs at mK Temperatures

D. Drung, J. Beyer, Jan-Hendrik Storm, Margret Peters, Thomas Schurig

Published Nov 10, 2010• 25 citations
Publisher

Abstract

The excess low-frequency flux noise in dc superconducting quantum interference devices (SQUIDs) operated at ultra-low temperatures was studied. A large number of single SQUIDs as well as SQUID arrays from 16 wafers fabricated over a period of six years were characterized at 4.2 K and1/fon the SQUID design or fabrication parameters. In contrast, below 4.2 K the low-frequency noise changed moderately or increased strongly depending on whether the bottom Nb or the insulation layer were fabricated in our newer sputter system instead of the older one. The corresponding excess noise levels ε1/fat1/f∝ f-αwith α typically around 0.6 for good devices. For devices with strong low-frequency excess noise, α increases up to about 0.9. The best energy resolution ε achieved so far with a 50 pH test SQUID operated at 16 mK is 0.62 h at 100 kHz, increasing to 1.64 h at 1 kHz and 14 h at 10 Hz.

DOI
10.1109/tasc.2010.2084054

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The excess low-frequency flux noise in dc superconducting quantum interference devices (SQUIDs) operated at ultra-low temperatures was studied. A large number of single SQUIDs as well as SQUID arrays from 16 wafers fabricated over a period of six years were characterized at 4.2 K and1/fon the SQUID design or fabrication parameters. In contrast, below 4.2 K the low-frequency noise changed moderately or increased strongly depending on whether the bottom Nb or the insulation layer were fabricated in our newer sputter system instead of the older one. The corresponding excess noise levels ε1/fat1/f∝ f-αwith α typically around 0.6 for good devices. For devices with strong low-frequency excess noise, α increases up to about 0.9. The best energy resolution ε achieved so far with a 50 pH test SQUID operated at 16 mK is 0.62 h at 100 kHz, increasing to 1.64 h at 1 kHz and 14 h at 10 Hz.
We have fabricated dc superconducting quantum interference devices (SQUIDs) incorporating Nb/Al-oxide/Nb Josephson junctions in both stripline and washer geometries. Low-frequency noise in excess of that predicted by the resistively-shunted junction model is present in both geometries and is demonstrated to be flux noise. This flux noise is not environmental. Improvements in fabrication processing over the past four years have reduced the level of this flux noise. SQUIDs are now fabricated with PdAu resistors, Nb wiring layers, and SiO/sub 2/ interlayer dielectric. In our best well-coupled SQUIDs, the white-noise energy sensitivity is 5/spl times/10/sup -31/ J/spl middot/s, with a 1/f knee below 0.1 Hz. We believe further reduction in the flux noise might be obtained with the use of on-chip flux shielding and/or trapping structures.
We examine the behavior of low frequency flux noise measured in ten Nb-NbOx-Pbln dc SQUIDs in the temperature range 1 K to 20 mK. As previously reported, the flux noise power spectrum SΦ(f) typically scales with frequency as A/fα. Remark ably, the excess noise power A at 1 Hz increases as the temperature is decreased below about 0.7 K, saturating to a value around (10 μΦα)2/Hz below about 0.2 K. Here we report on the dependence of both the magnitude A and the slope a on the size and linewidth of the SQUID loops. In particular, at the lowest temperatures we find that a declines to values as low as 0.5 in the smallest devices, while a is in the range 0.9-1 for the largest devices.
At temperatures below about 1 K, a series of dc superconducting quantum interference devices (SQUID’s) exhibited an apparent flux noise with a spectral density scaling as 1/f α, where 0.58<α<0.80. Typically, the magnitude of the noise increased as the temperature was lowered below 1 K, tending to flatten out at low temperatures with a value of 7±3 μΦ0Hz−1/2 at 1 Hz that was nearly independent of the parameters and materials of the SQUID’s. Although a large number of hypothetical sources of the noise have been eliminated, the origin remains unidentified.
A detailed study has been made of the low-frequency excess noise of rf superconducting quantum interference devices (SQUIDs), fabricated from thin niobium films and operated at 4.2 K, with rf bias frequencies of 0.15, 1.7, and 3 GHz. When the SQUIDs were operated in an open-loop configuration in the absence of low-frequency flux modulation, the demodulated rf voltage exhibited a substantial level 1/f noise, which was essentially independent of the rf bias frequency. As the rf bias frequency was increased, the crossover frequency at which the 1/f noise power was equal to the white noise power moved to higher frequencies, because of the reduction in white noise. On the other hand, when the SQUID was flux modulated at 50 kHz and operated in a flux locked loop, no 1/f noise was observed at frequencies above 0.5 Hz. A detailed description of how the combination of rf bias and flux modulation removes 1/f noise due to critical current fluctuations is given. Thus, the results demonstrate that the 1/f noise observed in these SQUIDs is generated by critical current fluctuations, rather than by the hopping of flux vortices in the niobium films.
The design, fabrication, and noise properties of an ultra-low-noise tunnel junction dc SQUID (superconducting quantum interference device) are presented. The two resistively shunted Pb-alloy tunnel junctions are each 3.6 μm diam. The SQUID has an inductance L of ≈11 pH, a critical current per junction, I0 of ≈100 μA, and a resistance per shunt R of ≈2 Ω. At 2.3 K, eI0R≈kBT, and simple theory predicts that the minimum intrinsic energy sensitivity should be ≈2h. The actual minimum value of the measured high-frequency (70 kHz) flux noise at 4.2 K is φn=1.3×10−7φ0 Hz−1/2. This corresponds to an intrinsic energy sensitivity, φ2n/2L, of 3.2×10−33 J Hz−1 or 5h. Lowering the bath temperature to 1.8 K gave no improvement in performance.
The comprehensive analysis of low-frequency excess flux noise both in terms of magnetic flux noise SΦ,1/f and energy sensitivity ϵ1∕f of 84 superconducting quantum devices studied at temperatures below 1 K reveals a universal behavior. When analyzing data in terms of ϵ1∕f, we find that noise spectra of independent devices cross each other all at certain crossing frequencies fc. Besides this main result of our paper, we further show that superconducting quantum interference device (SQUID) arrays systematically feature higher noise exponents than single SQUIDs and give evidence for a material and device type dependence of low-frequency excess flux noise. The latter results facilitate to engineer the shape of magnetic flux noise spectra and thus to experimentally modify key properties such as coherence or measurement times of superconducting quantum devices.