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IEEE/LEOS Summer Topical Meetings

High resolution measurement of polarization mode dispersion with quantum interferometry

Andrew M. Fraine, Roman I. Egorov, David S. Simon, Olga V. Minaeva, Alexander V. Sergienko

Published Jul 1, 2011• 0 citations
Publisher

Abstract

A new quantum interferometric technique for measuring polarization mode dispersion with a higher precision than classical techniques is introduced. This approach simultaneously allows extracting chromatic and polarization mode dispersion parameters from a single optical setup.
DOI
10.1109/phosst.2011.6000030

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