All-optical material characterization techniques and optical data links by the application of bistability in luminescence
B. Ullrich, Kazuhiko Misawa, T Kobayashi +1 more
All-optical bistability in luminescence of thin (⩽ 10 μm) CdS and CdS: Cu sprayed films on pyrex® was studied in the range of 700-1000 nm. The films were investigated between 80-210 K and excited by the 514.5 nm Ar + - laser line. The measurements were performed in transmission or reflection geometries using a monochromator or cut-off filters, respectively. The pronounced dependence of the luminescence intensity on temperature in the near infrared is found to be the origin of bistability in luminescence. Furthermore, we demonstrate that the loop contrasts depend on the wavelength investigated. By the application of this feature, we present, to the best of our knowledge for the first time, a possibility to measure doping concentrations of a semiconductor with a bistable device. Finally, new concepts are discussed to use luminescence bistability in all-optical or hybrid data links.
Physica Scripta•Apr 1, 1995•2 citations