The basic opportunity of bistable dependencies of medium temperature and vibrational energy of molecules on heat conduction parameter and on normalized VT-relaxation time is shown for light energy absorption at non-ground vibrational levels. Practical realization is possible, particularly, by usage of elliptically defocused beams. As a result there is anew opportunity to form high temperature domains in the any section of medium, using defocused light beams. The bistability property, discussed within the framework of the point model, is confirmed by modeling of a light pulse propagation in optically non-uniform vessel with molecular gas.
In this paper, we discuss a possibility to realize the optical bistability in a rotating semiconductor micro-cavity system. To study the mean cavity photon number profile, we have obtained stationary solution by solving Heisenberg–Langevin equations of motion. In a rotating semiconductor micro-cavity system, bistability is observed when the cavity is driven externally in one direction but not the other direction. The bistable behavior is possible for strong coupling regime, and this can be controlled by hopping strength, decay rates and pump power. The photon profile also shows tunable zero intensity window. The system may be useful to design all-optical switch and optical flip–flop i.e., optical memory element, which would be faster in applications and compact in size.
Optical bistability (OB) of Rydberg atoms provides a new, to the best of our knowledge, platform for studying nonequilibrium physics and a potential resource for precision metrology. To date, the observation of Rydberg OB has been limited in free space. Here, we explore cavity-enhanced Rydberg OB with a thermal cesium vapor cell. The signal of Rydberg OB in a cavity is enhanced by more than one order of magnitude compared with that in free space. The slope of the phase transition signal at the critical point is enhanced more than 10 times that without the cavity, implying an enhancement of two orders of magnitude in the sensitivity for Rydberg-based sensing and metrology.