Journal of Applied Physics
Radio-frequency properties of stacked long Josephson junctions with nonuniform bias current distribution
Giovanni Filatrella, N. F. Pedersen
Abstract
We have numerically investigated the behavior of stacks of long Josephson junctions considering a nonuniform bias profile. In the presence of a microwave field the nonuniform bias, which favors the formation of fluxons, can give rise to a change of the sequence of radio-frequency induced steps. The amplitude of the steps is enhanced when the external frequency matches the fluxon shuttling regime.