Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Time-resolved double-slit interference pattern measurement with entangled photons

Piotr Leszek Kolenderski, Carmelo Scarcella, Kelsey D. Johnsen, Deny R. Hamel, Catherine Holloway, Krister Shalm, Simone Tisa, Alberto Tosi, Kevin J. Resch, Thomas D. Jennewein

Published May 1, 2013• 2 citations

Publisher

Abstract

Summary form only given. The essence of wave-particle duality is that particles passing through slits form a pattern that can only be explained by resorting to wave mechanics. Here we present results that provide insight into the buildup of the multiple-slit interference pattern. The perfect time resolved measurements would ideally involve a single-particle source and an array of single-particle noiseless detectors featuring perfect quantum efficiency and time resolution. In previous experiments for electrons [1], photons [2] and molecules [3], detection of single particles was limited by minimum acquisition times, thus denying access to precise timing information. We make a significant step forward, approaching the perfect measurement very closely and showing real-time interference pattern buildup of single-photon detections as a result of passing through a system of multiple slits. These measurements accessed precise timing information, allowing us to analyse the interference pattern's formation process and effects of entanglement.

DOI: 10.1109/cleoe-iqec.2013.6801616

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