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Optics and Spectroscopy

An optical near-field microscope based on optical dimensional resonances of interacting atoms

Oleg N. Gadomsky, K. Yu. Moiseev

Published Jul 1, 2002• 3 citations
Publisher

Abstract

A concept was suggested for an optical near-field microscope based on optical dimensional resonances in the system of a needle tip atom + a sample atom. High sensitivity and spatial resolution of an order of 1 nm were shown to be characteristic of this microscope. Furthermore, the instrument is applicable to a wide range of studied samples.

DOI
10.1134/1.1496740

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A concept was suggested for an optical near-field microscope based on optical dimensional resonances in the system of a needle tip atom + a sample atom. High sensitivity and spatial resolution of an order of 1 nm were shown to be characteristic of this microscope. Furthermore, the instrument is applicable to a wide range of studied samples.
A scanning optical microscope whose active element (the tip) consists of a crystal containing impurity ions or color centers, which are excited by laser radiation, is proposed. The excitation energy from a single impurity center located at the point of the tip is transferred to the fluorescence centers of the experimental sample by the mechanism of resonant dipole-dipole exchange. It is shown that this approach can give nanometer spatial resolution with high sensitivity, which in many cases is much higher than the sensitivity of the “standard” near-field fluorescence microscopy.
Summary form only given. Recently, atom manipulation by using optical near fields has been attracting a lot of interests. Optical near field can be localized in a nanometric region, being free from the diffraction limit in contrast to propagation light. The intensity distribution of optical near field decays rapidly as an exponential-like function. Because such a spatially inhomogeneous light field can affect the resonant force on an atom (the so called dipole force), the optical near field produces the strong dipole force. Using the dipole force of the optical near field, we can expect to manipulate an atom with high spatial accuracy. Moreover, due to the resonant character of the dipole force, we can manipulate an atom species- and state-selectively. The optical near field localized in a nanometric region can be generated on the tip of a sharpened fiber-probe. This kind of fiber probe can be used for deflection of the atomic motion, and then trapping of an atom. To this end, it is very important to fabricate the fiber probe suitable for the atoms used. In this case, we must consider several parameters: a size and a shape of the tip, light intensity, frequency detuning, etc. In order to examine the optimal conditions for the fabrication, we measured and evaluated the optical near-field intensity distribution of the fiber-probe.
We realize a scanning probe microscope using single trapped ^{87}Rb atoms to measure optical fields with subwavelength spatial resolution. Our microscope operates by detecting fluorescence from a single atom driven by near-resonant light and determining the ac Stark shift of an atomic transition from other local optical fields via the change in the fluorescence rate. We benchmark the microscope by measuring two standing-wave Gaussian modes of a Fabry-Pérot resonator with optical wavelengths of 1560 and 781 nm. We attain a spatial resolution of 300 nm, which is superresolving compared to the limit set by the 780 nm wavelength of the detected light. Sensitivity to short length scale features is enhanced by adapting the sensor to characterize an optical field via the force it exerts on the atom.
Summary form only given. We have proposed deflection by an optical near field on a fiber probe to control atoms with high spatial accuracy. In this case, the deflection angle is estimated to be 0.1 degree for a Rb atom with an incident velocity of 10 m/s. It leads to the deviation of 10 /spl mu/m from the incident axis at 1 cm. in the downstream. To detect the deflected atoms with an accuracy of 1%, we need the spatial resolution of 100 nm. However, a commercial detector such as MCP has a low resolution of 50 /spl mu/m at most and the highest resolution that has been reported is 1 /spl mu/m to our knowledge. In addition, these are applied to metastable atoms and have less detection efficiency for the ground state atoms we manipulate. For drastic improvement, we present here a slit-type atom detector with a nanometric lateral resolution. Since the number of atoms deflected by the optical near field is very small, it is important to detect atoms with high efficiency. For this purpose, we use photoionization with two-color optical near fields.
Cavity quantum electrodynamics offers the possibility of observing and controlling the motion of a few or individual atoms, enabling the realization of various quantum technological tasks such as quantum enhanced metrology or quantum simulation of strongly correlated matter. A core limitation of these experiments lies in the mode structure of the cavity field, which is hard coded in the shape and geometry of the mirrors. As a result, most applications of cavity QED trade spatial resolution for enhanced sensitivity. Here, we propose and demonstrate a cavity-microscope device capable of controlling in space and time the coupling between atoms and light in a single-mode high-finesse cavity, reaching a spatial resolution an order of magnitude lower than the cavity-mode waist. This is achieved through local Floquet engineering of the atomic level structure, imprinting a corresponding atom-field coupling. We illustrate this capability by engineering micrometer-scale coupling, using cavity-assisted atomic measurements and optimization. Our system forms an optical device with a single optical axis, has the same footprint and complexity as a standard Fabry-Perot cavity or confocal lens pair, and can be used for any atomic species. This technique opens a wide range of perspectives, from ultrafast cavity-enhanced midcircuit readout to the quantum simulation of fully connected models of quantum matter such as the Sachdev-Ye-Kitaev model. Published by the American Physical Society 2024