Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Applied Optics

Probing limits on spatial resolution using nonlinear optical effects and nonclassical light

Yongzhang Leng, Dong Hun Park, Don C. Schmadel, V. Yun, Warren N. Herman, J. Goldhar

Published Dec 19, 2013• 1 citation
Publisher

Abstract

Using a simple optical setup to detect and characterize transmission gratings in the far field, we demonstrate that going beyond the diffraction limit is not possible using linear interaction of nonclassical illumination with the target grating. We also confirm that nonlinear optical interactions with the target grating, or with the optical medium around it, do allow improvement in resolution.

DOI
10.1364/ao.53.000051

Related papers

Superresolution Linear Optical Imaging in the Far Field

Anastasia A. Pushkina, G. Maltese, Jose Inacio Costa-Filho +2 more

The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern superresolution microscopy techniques employ active interaction with the object by exploiting its optical nonlinearities, nonclassical properties of the illumination beam, or near field probing. Thus, they are not applicable whenever such interaction is not possible, for example, in astronomy or noninvasive biological imaging. Far field, linear optical superresolution techniques based on passive analysis of light coming from the object would cover these gaps. In this Letter, we present the first proof-of-principle demonstration of such a technique for 2D imaging. It works by accessing information about spatial correlations of the image optical field and, hence, about the object itself via measuring projections onto Hermite-Gaussian transverse spatial modes. With a basis of 21 spatial modes in both transverse dimensions, we perform two-dimensional imaging with twofold resolution enhancement beyond the diffraction limit.

arXiv:2105.01743•Physical Review Letters•Dec 15, 2021•66 citations

Metrological resolution and nonclassicality in linear and nonlinear detection schemes

́Angel Rivas, Alfredo Luis

We examine whether metrological resolution beyond coherent states is a nonclassical effect. We show that this is true for linear detection schemes but false for nonlinear schemes, and propose a very simple experimental setup to test it. We find a nonclassicality criterion derived from quantum Fisher information.

•Feb 16, 2010•2 citations

Precision Quantum Metrology and Nonclassicality in Linear and Nonlinear Detection Schemes

́Angel Rivas, Alfredo Luis

We examine whether metrological resolution beyond coherent states is a nonclassical effect. We show that this is true for linear detection schemes but false for nonlinear schemes, and propose a very simple experimental setup to test it. We find a nonclassicality criterion derived from quantum Fisher information.

arXiv:1002.3075•Physical Review Letters•Jun 30, 2010•115 citations

Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements

Mankei Tsang

I propose a quantum imaging method that can beat the Rayleigh-Abbe diffraction limit and achieve de Broglie resolution without requiring a multiphoton absorber or coincidence detection. Using the same nonclassical states of light as those for quantum lithography, the proposed method requires only optical intensity measurements, followed by image postprocessing, to produce the same complex quantum interference patterns as those in quantum lithography. The method is expected to be experimentally realizable using current technology.

arXiv:0901.4817•Physical Review Letters•Jun 22, 2009•131 citations

Optical imaging beyond the diffraction limit via dark states

Hebin Li, Vladimir A. Sautenkov, Michael M. Kash +5 more

We study the possibility of creating spatial patterns having subwavelength size by using the so-called dark states formed by the interaction between atoms and optical fields. These optical fields have a specified spatial distribution. Our experiments in Rb vapor display spatial patterns that are smaller than the length determined by the diffraction limit of the optical system used in the experiment. This approach may have applications to interference lithography and might be used in coherent Raman spectroscopy to create patterns with subwavelength spatial resolution.

arXiv:0803.2557•Physical Review A•Jul 1, 2008•82 citations

Sub-diffraction-limited microscopy via Rabi gradient excitation

Xiaodong Zeng, Zeyang Liao, M. Al-Amri +1 more

We propose a scheme for microscopy with resolution far beyond the diffraction limit by using coherent Rabi oscillations. When the sample is illuminated by a gradient laser field, Rabi oscillations will be induced which can lead to a sinusoidal excitation in the sample. This is similar to the structured illumination microscopy (SIM) which can recover high-spatial-frequency components in the far field. However, different from linear SIM, the sinusoidal pattern here can have a spatial frequency much higher than that of the linear standing wave. Due to this property, we can achieve extremely high resolution, as in the nonlinear saturated SIM, but keep the reconstruction algorithm as simple as the linear one.

Physical Review A•Jun 11, 2015•5 citations
Using a simple optical setup to detect and characterize transmission gratings in the far field, we demonstrate that going beyond the diffraction limit is not possible using linear interaction of nonclassical illumination with the target grating. We also confirm that nonlinear optical interactions with the target grating, or with the optical medium around it, do allow improvement in resolution.
The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern superresolution microscopy techniques employ active interaction with the object by exploiting its optical nonlinearities, nonclassical properties of the illumination beam, or near field probing. Thus, they are not applicable whenever such interaction is not possible, for example, in astronomy or noninvasive biological imaging. Far field, linear optical superresolution techniques based on passive analysis of light coming from the object would cover these gaps. In this Letter, we present the first proof-of-principle demonstration of such a technique for 2D imaging. It works by accessing information about spatial correlations of the image optical field and, hence, about the object itself via measuring projections onto Hermite-Gaussian transverse spatial modes. With a basis of 21 spatial modes in both transverse dimensions, we perform two-dimensional imaging with twofold resolution enhancement beyond the diffraction limit.
I propose a quantum imaging method that can beat the Rayleigh-Abbe diffraction limit and achieve de Broglie resolution without requiring a multiphoton absorber or coincidence detection. Using the same nonclassical states of light as those for quantum lithography, the proposed method requires only optical intensity measurements, followed by image postprocessing, to produce the same complex quantum interference patterns as those in quantum lithography. The method is expected to be experimentally realizable using current technology.
We study the possibility of creating spatial patterns having subwavelength size by using the so-called dark states formed by the interaction between atoms and optical fields. These optical fields have a specified spatial distribution. Our experiments in Rb vapor display spatial patterns that are smaller than the length determined by the diffraction limit of the optical system used in the experiment. This approach may have applications to interference lithography and might be used in coherent Raman spectroscopy to create patterns with subwavelength spatial resolution.
We propose a scheme for microscopy with resolution far beyond the diffraction limit by using coherent Rabi oscillations. When the sample is illuminated by a gradient laser field, Rabi oscillations will be induced which can lead to a sinusoidal excitation in the sample. This is similar to the structured illumination microscopy (SIM) which can recover high-spatial-frequency components in the far field. However, different from linear SIM, the sinusoidal pattern here can have a spatial frequency much higher than that of the linear standing wave. Due to this property, we can achieve extremely high resolution, as in the nonlinear saturated SIM, but keep the reconstruction algorithm as simple as the linear one.