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Journal of Applied Physics

The effective dissipation in Nb/AlOx/Nb Josephson tunnel junctions by return current measurements

Roberto Cristiano, Luigi Frunzio, Ciro Nappi, Maria Gabriella Castellano, G. Torrioli, C. Cosmelli

Published Jun 1, 1997• 13 citations
Publisher

Abstract

Measurements of temperature dependence of the return current in high quality Nb/AlOx/Nb Josephson junctions are presented. From the experimental data, we obtain the effective resistance, i.e., the effective dissipation, for the retrapping process, according to the generalized resistively shunted junction model proposed by Chen, Fisher, and Leggett. We present a careful analysis, based on a comparison between the measured temperature dependencies of both the return and the quasiparticle tunneling current. We find that the junction subgap conductance, which includes the quasiparticle and the quasiparticle-pair interference terms, is responsible for the return process. The measurements have been performed on various samples, in a wide range of critical current densities from 50 to 2250 A/cm2, covering different damping regimes and spanning over the high and low temperature limits. Junctions with low critical current density show ideal dissipation which makes the return current scale with temperature according to the BCS exponential behavior without flattening out effects. This result may be relevant for the possible use of Nb/AlOx/Nb junctions in macroscopic quantum coherence experiments, which strongly require a very low dissipation.

DOI
10.1063/1.365282

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Applied Physics Letters•Aug 20, 2001•22 citations
Measurements of temperature dependence of the return current in high quality Nb/AlOx/Nb Josephson junctions are presented. From the experimental data, we obtain the effective resistance, i.e., the effective dissipation, for the retrapping process, according to the generalized resistively shunted junction model proposed by Chen, Fisher, and Leggett. We present a careful analysis, based on a comparison between the measured temperature dependencies of both the return and the quasiparticle tunneling current. We find that the junction subgap conductance, which includes the quasiparticle and the quasiparticle-pair interference terms, is responsible for the return process. The measurements have been performed on various samples, in a wide range of critical current densities from 50 to 2250 A/cm2, covering different damping regimes and spanning over the high and low temperature limits. Junctions with low critical current density show ideal dissipation which makes the return current scale with temperature according to the BCS exponential behavior without flattening out effects. This result may be relevant for the possible use of Nb/AlOx/Nb junctions in macroscopic quantum coherence experiments, which strongly require a very low dissipation.
Josephson junctions based on Nb/AlOx/Nb trilayer technology have demonstrated excellent quality, exhibiting very low dissipation in the subgap region. This property is very important for all those experiments which have to deal with the quantum behavior of macroscopic variables in Josephson devices. In view of performing an experiment of macroscopic quantum coherence with a Josephson device, we measured the escape temperature and the return current of several junctions fabricated with different processes and having different characteristics, by cooling them from 4.2 to 0.3 K. We show that, for what concerns the process of escape from the zero-voltage state, no difference can be found among different junctions. On the other hand, the dissipation properties are strongly influenced by the current density, with lower current density resulting in lower intrinsic dissipation.
We present an experimental study of the effective dissipation relevant in the thermally activated supercurrent decay of extremely underdamped Josephson junctions. Data referring to the supercurrent decay of Nb/AlOx/Nb{\mathrm{N}\mathrm{b}/\mathrm{A}\mathrm{l}\mathrm{O}}_{x}/\mathrm{Nb}Nb/AlOx​/Nb Josephson junctions are compared with the Kramers theory. Our measurements allow us to obtain the ``effective'' resistance to be used in the resistively shunted junction model that results to be the subgap resistance due to the presence of thermally activated quasiparticles. The extremely low dissipation level obtained at low temperatures renders our result quite interesting in view of experiments in the quantum limit.
In an effort to determine the suitability of Josephson junctions for applications in quantum computation, we measured low-noise dc current-voltage characteristics of Nb/AlO/sub x//Nb and Al/AlO/sub x//Al junctions in the temperature range from 90 mK to 1 K. Nb-based samples were obtained from several different facilities with critical currents of a few /spl mu/A and critical current densities between 100 and 3000 A/cm/sup 2/. We fabricated the Al-based samples using double-angle evaporation and obtained critical currents of a few /spl mu/A with critical current densities of about 30 A/cm/sup 2/. We found that the sub-gap leakage current in the Nb-based samples does not depend on temperature in the range 90 mK to 1 K, whereas that for the Al-based samples follows the expected BCS behavior to about 150 mK. Our Al-based samples have a lower level of dissipation than Nb-based devices; however, both Al- and Nb-based samples achieved dissipation levels sufficiently low for some quantum computing applications.
The effect of the voltage-dependent junction resistance R/sub j/ on the critical current decay of Josephson junctions was studied. In the thermal regime, the author has obtained a simple expression for the lifetime of the zero-voltage state which takes into account the nonlinear dependence of R/sub j/ on the voltage, removing an assumption of the resistivity shunted junction model (RSJ), which assumes an ohmic shunt resistance to describe the junction dissipation. These results are confirmed by experimental data which also show the relevance of the intrinsic dissipation due to the presence of quasiparticles. This latter aspect is relevant, because it allows extremely underdamped systems to be obtained at low temperatures. These conditions are particularly interesting to study a macroscopic quantum aspect, namely the effects of the presence of quantized energy levels on the supercurrent decay. The dependence of this latter effect on the junction resistance is also briefly discussed.
We measured the low frequency critical current noise in Nb/AlOx/Nb Josephson junctions. Unshunted junctions biased above the gap voltage and resistively shunted junctions biased near the critical current Ic have been measured. For both, the spectral density of δIc/Ic, Sic(f), is proportional to 1/f, scales inversely as the area A and is independent of Jc≡Ic/A over a factor of nearly 20 in Jc. For all devices measured at 4.2 K, Sic(1 Hz)=2.0±0.4×10−12/Hz when scaled to A=1 μm2. We find that, from 4.2 to 0.46 K, Sic(f) decreases linearly with temperature.
We present Nb/AlOx/Nb–Al/AlOx/Nb stacked Josephson junctions which we propose as three-terminal elements to control the quantum behavior of Josephson complex systems. A bias current can be independently injected in the “top” junction, providing a fine control of the critical current of the “bottom” junction. The reported characterization of the device refers to data in the classical limit including measurements of the switching dynamics between metastable states of the system at different temperatures and bias conditions. At low temperature, the effective dissipation of the bottom junction remains substantially unchanged when different injection currents flow in the top junction. These results are interesting to project new configurations of macroscopic quantum experiments.