Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

IEEE Transactions on Applied Superconductivity

Sub-gap leakage in Nb/AlO/sub x//Nb and Al/AlO/sub x//Al Josephson junctions

M. A. Gubrud, Mikkel Ejrnaes, A. J. Berkley, Roberto Ramos, Insik Jin, J. R. Anderson, Alex J. Dragt, Christopher J. Lobb, F. C. Wellstood

Published Mar 1, 2001• 18 citations
Publisher

Abstract

In an effort to determine the suitability of Josephson junctions for applications in quantum computation, we measured low-noise dc current-voltage characteristics of Nb/AlO/sub x//Nb and Al/AlO/sub x//Al junctions in the temperature range from 90 mK to 1 K. Nb-based samples were obtained from several different facilities with critical currents of a few /spl mu/A and critical current densities between 100 and 3000 A/cm/sup 2/. We fabricated the Al-based samples using double-angle evaporation and obtained critical currents of a few /spl mu/A with critical current densities of about 30 A/cm/sup 2/. We found that the sub-gap leakage current in the Nb-based samples does not depend on temperature in the range 90 mK to 1 K, whereas that for the Al-based samples follows the expected BCS behavior to about 150 mK. Our Al-based samples have a lower level of dissipation than Nb-based devices; however, both Al- and Nb-based samples achieved dissipation levels sufficiently low for some quantum computing applications.

DOI
10.1109/77.919518

Related papers

Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature

Wei Qiu, Hirotaka Terai, Z. Wang

Superconducting qubit circuits require high quality low critical current density Josephson tunnel junctions. We have developed high quality epitaxial NbN/AlN/NbN tunnel junctions with critical current density, Jc, ranging from as low as a few A/cm2to a few tens of kA/cm2. In this work, we measured current-voltage characteristics for junctions with a Jc~ 32 A/cm2in the temperature range from 17 mK to above 6.7 K. All the junctions are in good quality and have a high gap voltage (>; 5.5 mV). We found that the junctions' sub-gap resistances were temperature dependent above 2.5 K and saturated at temperatures below 2.5 K. A junction sub-gap leakage current Irof about 23 pA was measured. The voltage noise power spectral density for 3 junctions with different sizes has been measured at the base temperature of 17 mK with the junctions biased above the gap voltage. The spectral densities clearly show 1/fbehavior at low frequency and are proportional to the junction's linear dimension.

IEEE Transactions on Applied Superconductivity•Nov 10, 2010•5 citations

Fabrication of high-quality submicron Nb/Al-AlO x /Nb tunnel junctions

Haifeng Yu, Cao Wen-Hui, Zhu Xiao-Bo +6 more

Nb/Al–AlO x /Nb tunnel junctions are often used in the studies of macroscopic quantum phenomena and superconducting qubit applications of the Josephson devices. In this work, we describe a convenient and reliable process using electron beam lithography for the fabrication of high-quality, submicron-sized Nb/Al–AlO x /Nb Josephson junctions. The technique follows the well-known selective Nb etching process and produces high-quality junctions with V m = 100 mV at 2.3 K for the typical critical current density of 2.2 kA/cm 2 , which can be adjusted by controlling the oxygen pressure and oxidation time during the formation of the tunnelling barrier. We present the results of the temperature dependence of the sub-gap current and in-plane magnetic-field dependence of the critical current, and compare them with the theoretical predictions.

Chinese Physics B•Aug 1, 2008•7 citations

Harmonic current-phase relation in Nb–Al-based superconductor/insulator/normal conductor/insulator/superconductor-type Josephson junctions between 4.2 K and the critical temperature

Martin Götz, Vladimir V. Khanin, H. Schulze +6 more

For a study of the supercurrent–phase relationship, we have fabricated Nb/Al/AlOx/Al/AlOx/Al/Nb-based Josephson junctions of low critical current density. At 4.2 K, junctions of a nominal area of 10×10 μm2 showed a nonhysteretic dc current–voltage characteristic with a critical current of about 10 μA. Similar junctions were part of washer-type rf superconductor quantum interference devices. These samples were inductively coupled to high-quality tank circuits for measurements at 4.2 K or at higher temperatures up to values close to the critical temperature of niobium. In this range, the current–phase relation, as deduced from impedance measurements of the phase-biased junction, did not deviate significantly from the sinusoidal shape.

Applied Physics Letters•Aug 28, 2000•5 citations

Switching dynamics of Nb/AlOx/Nb Josephson junctions: Measurements for an experiment of macroscopic quantum coherence

Maria Gabriella Castellano, Roberto Leoni, G. Torrioli +7 more

Josephson junctions based on Nb/AlOx/Nb trilayer technology have demonstrated excellent quality, exhibiting very low dissipation in the subgap region. This property is very important for all those experiments which have to deal with the quantum behavior of macroscopic variables in Josephson devices. In view of performing an experiment of macroscopic quantum coherence with a Josephson device, we measured the escape temperature and the return current of several junctions fabricated with different processes and having different characteristics, by cooling them from 4.2 to 0.3 K. We show that, for what concerns the process of escape from the zero-voltage state, no difference can be found among different junctions. On the other hand, the dissipation properties are strongly influenced by the current density, with lower current density resulting in lower intrinsic dissipation.

Journal of Applied Physics•Sep 1, 1996•30 citations

Temperature-dependent current-voltage characteristics of niobium SNIS Josephson junctions

V. Lacquaniti, Mikhail A. Belogolovskii, Domenico Andreone +4 more

Motivated by a search for a suitable technology to fabricate Josephson junctions with a tunable damping regime, we performed a systematic study of the temperature effect on the critical current in Nb/Al-AlO x -Nb heterostructures with a nanometer-thick Al interlayer. For Al layer thicknesses ranging from 40 to 110 nm, we have observed a transition from hysteretic (below 4.2 K) to non-hysteretic (above 4.2 K) current-voltage curves. Measured supercurrent-vs-temperature characteristics which significantly differ from those of traditional SIS and SNS devices are interpreted in terms of the superconducting proximity effect between Al and Nb films. Thermal stability and good reproducibility of our junctions are demonstrated.

Journal of Physics Conference Series•Jun 1, 2010•2 citations

The effective dissipation in Nb/AlOx/Nb Josephson tunnel junctions by return current measurements

Roberto Cristiano, Luigi Frunzio, Ciro Nappi +3 more

Measurements of temperature dependence of the return current in high quality Nb/AlOx/Nb Josephson junctions are presented. From the experimental data, we obtain the effective resistance, i.e., the effective dissipation, for the retrapping process, according to the generalized resistively shunted junction model proposed by Chen, Fisher, and Leggett. We present a careful analysis, based on a comparison between the measured temperature dependencies of both the return and the quasiparticle tunneling current. We find that the junction subgap conductance, which includes the quasiparticle and the quasiparticle-pair interference terms, is responsible for the return process. The measurements have been performed on various samples, in a wide range of critical current densities from 50 to 2250 A/cm2, covering different damping regimes and spanning over the high and low temperature limits. Junctions with low critical current density show ideal dissipation which makes the return current scale with temperature according to the BCS exponential behavior without flattening out effects. This result may be relevant for the possible use of Nb/AlOx/Nb junctions in macroscopic quantum coherence experiments, which strongly require a very low dissipation.

Journal of Applied Physics•Jun 1, 1997•13 citations
In an effort to determine the suitability of Josephson junctions for applications in quantum computation, we measured low-noise dc current-voltage characteristics of Nb/AlO/sub x//Nb and Al/AlO/sub x//Al junctions in the temperature range from 90 mK to 1 K. Nb-based samples were obtained from several different facilities with critical currents of a few /spl mu/A and critical current densities between 100 and 3000 A/cm/sup 2/. We fabricated the Al-based samples using double-angle evaporation and obtained critical currents of a few /spl mu/A with critical current densities of about 30 A/cm/sup 2/. We found that the sub-gap leakage current in the Nb-based samples does not depend on temperature in the range 90 mK to 1 K, whereas that for the Al-based samples follows the expected BCS behavior to about 150 mK. Our Al-based samples have a lower level of dissipation than Nb-based devices; however, both Al- and Nb-based samples achieved dissipation levels sufficiently low for some quantum computing applications.
Superconducting qubit circuits require high quality low critical current density Josephson tunnel junctions. We have developed high quality epitaxial NbN/AlN/NbN tunnel junctions with critical current density, Jc, ranging from as low as a few A/cm2to a few tens of kA/cm2. In this work, we measured current-voltage characteristics for junctions with a Jc~ 32 A/cm2in the temperature range from 17 mK to above 6.7 K. All the junctions are in good quality and have a high gap voltage (>; 5.5 mV). We found that the junctions' sub-gap resistances were temperature dependent above 2.5 K and saturated at temperatures below 2.5 K. A junction sub-gap leakage current Irof about 23 pA was measured. The voltage noise power spectral density for 3 junctions with different sizes has been measured at the base temperature of 17 mK with the junctions biased above the gap voltage. The spectral densities clearly show 1/fbehavior at low frequency and are proportional to the junction's linear dimension.
Nb/Al–AlO x /Nb tunnel junctions are often used in the studies of macroscopic quantum phenomena and superconducting qubit applications of the Josephson devices. In this work, we describe a convenient and reliable process using electron beam lithography for the fabrication of high-quality, submicron-sized Nb/Al–AlO x /Nb Josephson junctions. The technique follows the well-known selective Nb etching process and produces high-quality junctions with V m = 100 mV at 2.3 K for the typical critical current density of 2.2 kA/cm 2 , which can be adjusted by controlling the oxygen pressure and oxidation time during the formation of the tunnelling barrier. We present the results of the temperature dependence of the sub-gap current and in-plane magnetic-field dependence of the critical current, and compare them with the theoretical predictions.
For a study of the supercurrent–phase relationship, we have fabricated Nb/Al/AlOx/Al/AlOx/Al/Nb-based Josephson junctions of low critical current density. At 4.2 K, junctions of a nominal area of 10×10 μm2 showed a nonhysteretic dc current–voltage characteristic with a critical current of about 10 μA. Similar junctions were part of washer-type rf superconductor quantum interference devices. These samples were inductively coupled to high-quality tank circuits for measurements at 4.2 K or at higher temperatures up to values close to the critical temperature of niobium. In this range, the current–phase relation, as deduced from impedance measurements of the phase-biased junction, did not deviate significantly from the sinusoidal shape.
Josephson junctions based on Nb/AlOx/Nb trilayer technology have demonstrated excellent quality, exhibiting very low dissipation in the subgap region. This property is very important for all those experiments which have to deal with the quantum behavior of macroscopic variables in Josephson devices. In view of performing an experiment of macroscopic quantum coherence with a Josephson device, we measured the escape temperature and the return current of several junctions fabricated with different processes and having different characteristics, by cooling them from 4.2 to 0.3 K. We show that, for what concerns the process of escape from the zero-voltage state, no difference can be found among different junctions. On the other hand, the dissipation properties are strongly influenced by the current density, with lower current density resulting in lower intrinsic dissipation.
Motivated by a search for a suitable technology to fabricate Josephson junctions with a tunable damping regime, we performed a systematic study of the temperature effect on the critical current in Nb/Al-AlO x -Nb heterostructures with a nanometer-thick Al interlayer. For Al layer thicknesses ranging from 40 to 110 nm, we have observed a transition from hysteretic (below 4.2 K) to non-hysteretic (above 4.2 K) current-voltage curves. Measured supercurrent-vs-temperature characteristics which significantly differ from those of traditional SIS and SNS devices are interpreted in terms of the superconducting proximity effect between Al and Nb films. Thermal stability and good reproducibility of our junctions are demonstrated.
Measurements of temperature dependence of the return current in high quality Nb/AlOx/Nb Josephson junctions are presented. From the experimental data, we obtain the effective resistance, i.e., the effective dissipation, for the retrapping process, according to the generalized resistively shunted junction model proposed by Chen, Fisher, and Leggett. We present a careful analysis, based on a comparison between the measured temperature dependencies of both the return and the quasiparticle tunneling current. We find that the junction subgap conductance, which includes the quasiparticle and the quasiparticle-pair interference terms, is responsible for the return process. The measurements have been performed on various samples, in a wide range of critical current densities from 50 to 2250 A/cm2, covering different damping regimes and spanning over the high and low temperature limits. Junctions with low critical current density show ideal dissipation which makes the return current scale with temperature according to the BCS exponential behavior without flattening out effects. This result may be relevant for the possible use of Nb/AlOx/Nb junctions in macroscopic quantum coherence experiments, which strongly require a very low dissipation.