Response of a Nb/Al{sub 2}O{sub 3}/Nb Tunnel Junction to Picosecond Electrical Pulses
Chandu A. Karadi, S. Verghese, C. A. Mears, J. Orenstein, P. L. Richards, Andrew T. Barfknecht
Abstract
Picosecond electrical pulses were used to measure the broadband quasiparticle response of a Nb trilayer SIS (superconductor-insulator-superconductor) junction in both the linear and nonlinear regimes. The electrical pulses were generated by illuminating a Si photoconducting switch using a Ti-sapphire laser. The SIS response is inferred by measuring the dc current induced by interfering two electrical pulses at the junction, as a function of the time delay between them. Results are obtained for bias voltages of 1.0 and 2.0 mV; at the latter, two-photon absorption was detected.