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Accurate critical exponents from the ε-expansion

J. C. Le Guillou, Jean Zinn‐Justin

Published Jan 1, 1990• 30 citations
Publisher
DOI
10.1016/b978-0-444-88597-5.50076-4

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This is the third article in a sequence in which we reexamine the calculation of the critical exponents of the N-vector model from field theory. In the first article we have applied summation methods to the ε-expansion for which new terms have been calculated (up to order ε5). In the second article we have incorporated in the summation method, in the case of Ising-like systems (N = 1), the knowledge of the exact values of exponents in d = 2 dimensions. Since exact values are now also known in the case of polymers (N = 0), we apply here the same method to this case. Moreover, since for the exponent η for N = 1 the results coming from the ε-expansion and perturbation series at fixed dimension are slightly different, we have recalculated the exponents in the latter case using the variant of the summation method developed for the ε-expansion. The results do not change significantly showing both the reliability and the limits of the method.

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Recent theoretical estimates of the critical exponents

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This is the third article in a sequence in which we reexamine the calculation of the critical exponents of the N-vector model from field theory. In the first article we have applied summation methods to the ε-expansion for which new terms have been calculated (up to order ε5). In the second article we have incorporated in the summation method, in the case of Ising-like systems (N = 1), the knowledge of the exact values of exponents in d = 2 dimensions. Since exact values are now also known in the case of polymers (N = 0), we apply here the same method to this case. Moreover, since for the exponent η for N = 1 the results coming from the ε-expansion and perturbation series at fixed dimension are slightly different, we have recalculated the exponents in the latter case using the variant of the summation method developed for the ε-expansion. The results do not change significantly showing both the reliability and the limits of the method.