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Nonlinear Optics

Scaling limits for single-photon Kerr phase shifts in integrated EIT

Holger Schmidt

Published Jan 1, 2004• 0 citations
Publisher

Abstract

We analyze integration of electromagnetically induced transparency in alkali atoms on a semiconductor chip. We derive the scaling laws for single-photon Kerr phase shifts and reduction in group velocity as a function of device dimensions.
DOI
10.1364/nlo.2004.tua6

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We analyze the integration of electromagnetically induced transparency in alkali atoms on a semiconductor chip. We propose the use of antiresonant reflecting optical waveguides with hollow cores to realize the necessary waveguiding capability and optical mode areas of a few square micrometers. We derive the scaling laws and limitations for the reduction in group velocity and single-photon phase shifts as a function of waveguide dimension. We show that miniaturization leads to a large enhancement of single-photon cross-phase modulation, despite the presence of additional limitations due to coherence dephasing and waveguide loss.
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We present an experiment using a sample of laser-cooled Rb atoms to show that cross-phase modulation schemes continue to benefit from electromagnetically induced transparency (EIT) even as the transparency window is made narrower than the signal bandwidth (i.e., for signal pulses much shorter than the response time of the EIT system). Addressing concerns that narrow EIT windows might not prove useful for such applications, we show that while the peak phase shift saturates in this regime, it does not drop, and the time-integrated effect continues to scale inversely with EIT window width. This integrated phase shift is an important figure of merit for tasks such as the detection of single-photon-induced cross-phase shifts. Only when the window width approaches the system's dephasing rate γ does the peak phase shift begin to decrease, leading to an integrated phase shift that peaks when the window width is equal to 4γ.