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Applied Physics Letters

Modelling the resistive state in a transition edge sensor

Alexander G. Kozorezov, Alexander A. Golubov, Didier D. E. Martin, Piet A. J. de Korte, M. A. Lindeman, R. A. Hijmering, Jan van der Kuur, Henk F. C. Hoevers, Luciano G. Gottardi, M. Yu. Kupriyanov, J. Keith Wigmore

Published Aug 8, 2011• 51 citations
Publisher

Abstract

We have developed a model for the resistive transition in a transition edge sensor (TES) based on the model of a resistively and capacitively shunted junction, taking into account phase-slips of a superconducting system across the barriers of the tilted washing board potential. We obtained analytical expressions for the resistance of the TES, R(T, I), and its partial logarithmic derivatives αI and βI as functions of temperature and current. We have shown that all the major parameters describing the resistive state of the TES are determined by the dependence on temperature of the Josephson critical current, rather than by intrinsic properties of the S-N transition. The complex impedance of a pristine TES exhibits two-pole behaviour due to its own intrinsic reactance.

DOI
10.1063/1.3621829

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IEEE Transactions on Applied Superconductivity•Sep 3, 2015•4 citations
We have developed a model for the resistive transition in a transition edge sensor (TES) based on the model of a resistively and capacitively shunted junction, taking into account phase-slips of a superconducting system across the barriers of the tilted washing board potential. We obtained analytical expressions for the resistance of the TES, R(T, I), and its partial logarithmic derivatives αI and βI as functions of temperature and current. We have shown that all the major parameters describing the resistive state of the TES are determined by the dependence on temperature of the Josephson critical current, rather than by intrinsic properties of the S-N transition. The complex impedance of a pristine TES exhibits two-pole behaviour due to its own intrinsic reactance.
We report the experimental evidence of the ac Josephson effect in a transition edge sensor (TES) operating in a frequency domain multiplexer and biased by ac voltage at MHz frequencies. The effect is observed by measuring the non-linear impedance of the sensor. The TES is treated as a weakly linked superconducting system and within the resistively shunted junction model framework. We provide a full theoretical explanation of the results by finding the analytic solution of the non-inertial Langevian equation of the system and calculating the non-linear response of the detector to a large ac bias current in the presence of noise.
The responsivity and noise of a voltage-biased superconducting transition-edge sensor depends strongly on the details of its thermal model, and the simplest theory for TES response assumes a single heat capacity connected to the heat bath. Here, analytical results are derived and discussed for the complex impedance, the responsivity and the noise of a transition-edge sensor, when the thermal model is not simple but consists of either two or three connected heat capacities. The implications of the differences of the models are discussed, as well.
Understanding the weak thermal links in supporting legs of transition edge sensors (TES) is crucial for developing highly sensitive bolometers used in cosmic microwave background (CMB) detection. Conventional current-biased differential resistance measurements under varying temperature (R-T) used to characterizeRand critical temperature (Tc) of TES often encounter a phenomenon: the bias current will affect the transition temperature obtained duringTbdrop testing, as well as affect the obtained shape of the transition region. This behavior stems from the weak thermal links of TES under current bias, limitingR-Tmeasurements to only rough information about the TES transition regime sometimes. The detailed and accurate performance parameters typically relying on voltage-biased current-voltageI-Vmeasurements using using superconducting quantum interference devices (SQUIDs). In fact, the positive electro-thermal feedback induced by current bias contains valuable insights into the device's intrinsic properties. This work focuses on elaborating this underlying mechanism: by analyzing the current-induced suppression of measured transition temperature inR-Tmeasurements, we extract key parameters including thermal conductance (G), thermal exponent (n),Tc, and saturation power (Psat). This study provides intuitive calculations and visualizations of the electro-thermal behaviors induced by current bias in TES devices, and offers a simple and rapid complementary tool for electro-thermal parameter extraction. In batch TES fabrication, it can serve as a pre-screening tool to improve the efficiency of subsequent high-precision SQUID-basedI-Vcharacterization.
We present a detailed analysis of the fundamental noise sources in superconducting transition-edge sensors (TESs), ac voltage biased at MHz frequencies and treated as superconducting weak links. We have studied the noise in the resistive transition as a function of bath temperature of several detectors with different normal resistances and geometries. We show that the "excess" noise, typically observed in the TES electrical bandwidth, can be explained by the equilibrium Johnson noise of the quasiparticles generated within the weak link. The fluctuations at the Josephson frequency and higher harmonics contribute significantly to the measured voltage noise at the detector bandwidth through the nonlinear response of the weak link with a sinusoidal current-phase relation.
Optical superconducting transition-edge sensor (TES) has been widely used in quantum information, biological imaging, and fluorescence microscopy owing to its high quantum efficiency, low dark count, and photon number resolving capability. The temperature sensitivity (αI ) and current sensitivity (βI ) are important parameters for optical TESs, which are generally extracted from the complex impedance. Here we present a method to extract αI and βI based on a two-fluid model and compare the calculated current–voltage curves, pulse response, and theoretical energy resolution with the measured ones. This method shows qualitative agreement that is suitable for further optimization of optical TESs.
We systematically study the analysis and simulation of ac-biased superconductor transition-edge sensor (TES) circuits. In these ac-biased circuits, the current and voltage of the TES experience large swings in both directions, and small-signal analysis around a dc steady state does not apply. To understand their electrical and thermal behavior, we rely on concepts and techniques from radio-frequency circuit simulation and introduce the periodic steady state and perform periodic ac analysis. We also construct TES device models based on a comprehensive two-fluid physical model and investigate the behavior of ac-biased TES circuits using advanced circuit simulators. By relating our findings to results for the analysis of dc-biased TES circuits, we give appropriate definitions for the current and temperature sensitivity of the TES in ac-biased circuits. Our work not only builds a rigorous foundation for theoretical analysis of ac-biased TES circuits but also introduces powerful simulation techniques valuable for their design and research.