IEEE Transactions on Applied Superconductivity
Unraveling Current-Bias-Induced Transition Discrepancy in Transition-Edge Sensors in R-T Tests and Establishing a Reliable Characterizing Method
Qing Yu, Yongping Li, Guanhua Gao, Yu Xu, Kaiyong He, Mingjun Cheng, Zhengwei Li, S. Shu, Guodong Chen, Wei Chen
Abstract
Understanding the weak thermal links in supporting legs of transition edge sensors (TES) is crucial for developing highly sensitive bolometers used in cosmic microwave background (CMB) detection. Conventional current-biased differential resistance measurements under varying temperature (R-T) used to characterizeRand critical temperature (Tc) of TES often encounter a phenomenon: the bias current will affect the transition temperature obtained duringTbdrop testing, as well as affect the obtained shape of the transition region. This behavior stems from the weak thermal links of TES under current bias, limitingR-Tmeasurements to only rough information about the TES transition regime sometimes. The detailed and accurate performance parameters typically relying on voltage-biased current-voltageI-Vmeasurements using using superconducting quantum interference devices (SQUIDs). In fact, the positive electro-thermal feedback induced by current bias contains valuable insights into the device's intrinsic properties. This work focuses on elaborating this underlying mechanism: by analyzing the current-induced suppression of measured transition temperature inR-Tmeasurements, we extract key parameters including thermal conductance (G), thermal exponent (n),Tc, and saturation power (Psat). This study provides intuitive calculations and visualizations of the electro-thermal behaviors induced by current bias in TES devices, and offers a simple and rapid complementary tool for electro-thermal parameter extraction. In batch TES fabrication, it can serve as a pre-screening tool to improve the efficiency of subsequent high-precision SQUID-basedI-Vcharacterization.