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Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Breaking the diffraction limit using entanglement based microscopy

Daniel Schlenk, Harald Weinfurter

Published Sep 26, 2013• 1 citation
Publisher

Abstract

The resolution of optical scanning microscopes is limited by the spot size of the scanning beam. It has been proposed by Boto1 et al. and Nasr2 et al. that momentum entangled photons can be focused more tightly than classical light. Thus they should enable one to break the di ractive resolution limit. We report experiments measuring the spatial distribution of strong focussed momentum entangled photon pairs at a center wavelength of 812 nm from a spontaneous parametric down conversion source. Using a single gold stripe deposited on a glass surface as test object we observe a two-photon spot size as small as 194 nm, thereby beating the di raction limit even for conventional two-photon microscopy.

DOI
10.1117/12.2023010

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The resolution of optical scanning microscopes is limited by the spot size of the scanning beam. It has been proposed by Boto1 et al. and Nasr2 et al. that momentum entangled photons can be focused more tightly than classical light. Thus they should enable one to break the di ractive resolution limit. We report experiments measuring the spatial distribution of strong focussed momentum entangled photon pairs at a center wavelength of 812 nm from a spontaneous parametric down conversion source. Using a single gold stripe deposited on a glass surface as test object we observe a two-photon spot size as small as 194 nm, thereby beating the di raction limit even for conventional two-photon microscopy.
All forms of microscopy that have previously been developed rely on classical sources of light, which are relatively noisy by virtue of the photons arriving randomly in time and position. We propose a new technique of two-beam optical microscopy using a nonclassical light source comprising entangled photon pairs generated by the process of nonlinear optical parametric downconversion. Entangled-photon microscopy (EPM) has the potential for providing a substantial improvement over confocal laser scanning fluorescence microscopy (CLSM) as well as over two-photon laser scanning fluorescence microscopy (TPLSM). The latter technique relies on the proportionality of the two-photon absorption rate to the square of the optical photon-flux density, and makes use of a highly focused optical beam to localize the region from which fluorescence is observed. However, because the arrival of pairs of photons is accidental in TPLSM, relatively large values of the photon-flux density are required to achieve photon coincidence and hence absorption. This can lead to undesired phototoxicity and photobleaching of the specimen. EPM, in contrast, relies on the presence of highly correlated photon pairs, which enhances the two-photon absorption rate significantly and enables lower values of the photon-flux density to be used. The process depends linearly, rather than quadratically, on the photon-flux density. Further, the EPM interaction region can be controlled by the use of two beams, providing increased flexibility in the selection of desired regions of a specimen, and leading to enhanced axial and lateral resolution.
We report an experimental observation of quantum Airy disk diffraction pattern using an entangled two-photon source. In contrast to the previous quantum lithography experiments where the subwavelength diffraction patterns were observed in the far field limit, we perform the Fraunhofer diffraction experiment with a convex lens. The experimental result shows that the two-photon Airy disk is provided with the super-resolution spot, which surpasses the classical diffraction limit. In particular, the spot size can be well controlled by the focal length, which adapted to optical super-focusing. Our experiment can promote potential application of quantum lithography.
The resolution of traditional optical microscope and optical lithography is limited by about half wavelength of the light source, which is well known as the diffraction limit or Abbe limit. The resolution limit is due to the missing of high spatial frequency components in the far-field. One way to achieve high resolution is to move the detector into the near-field region where the evanescent wave can be collected. However, these methods are surface-bound and usually very slow which have limited applications. It has long been an interesting and important question about how to overcome the diffraction limit in the far-field.\n\nFor optical lithography, a number of methods have been proposed to overcome the diffraction limit such as multi-photon scanning, quantum entanglement, quantum inspired process (e.g., dopperlon), and quantum dark state. However, these methods either require multi-photon absorber, quantum entanglement, or multi-energy levels, which restrict them from extending to higher resolution in practice. In this thesis, we showed that sub-diffraction-limited resolution can be generated by the coherent Rabi gradient. This method does not require multi-photon absorber or quantum entanglement but just quantum coherence of the medium. Extension from lower resolution to higher resolution is very straightforward where we just need to increase the pulse intensity or pulse duration. We also proposed two atom lithography experiments based on the Rabi gradient. The first one uses Rubidium Rydberg atom and microwave where we showed that sub-micrometer line spacing is possible. The second one uses Chromium atom and optical field where we showed that sub-10nm line spacing is possible while the wavelength of the light is about 400nm.\n\nFor optical imaging, a number of methods have also been proposed to achieve super-resolution such as multi-photon microscope, stimulated-emission-depletion, structured illumination microscopy, centroid-based techniques and metamaterial-based lens. Here, we will show a new method to achieve resolution beyond the diffraction limit which we called it resonance fluorescence microscopy. Resonance fluorescence has been proposed to localize a single atom with resolution beyond the diffraction limit. The separation between two atoms can also be extracted from the resonance\nfluorescence spectrum. To develop it as microscopy, we need to evaluate the resonance fluorescence spectrum of multiple-atom system. We analytically solved the general feature of the spectrum when the Rabi frequency is much larger than the dipole-dipole interaction and showed how to extract the spatial information of the atoms with resolution far beyond the diffraction limit. This method is entirely based on far-field techniques and it does not require point-by-point scanning.
We consider a microscopy setting where quantum light is used for illumination. Spontaneous parametric down conversion (SPDC) is used as a source of a heralded single photon, which is quantum light prepared in a Fock state. We present analytical formulas for the spatial mode tracking along with the heralded and non-heralded mode widths. The obtained analytical results are supported by numerical calculations and the following discussion taking into account realistic setup parameters such as finite-size optics and finite-size single-photon detectors. This allows us to observe that the diffraction limit can be approached with simultaneous alleviation of the photon loss leading to increased signal-to-noise ratio - a factor limiting practical applications of quantum light. Additionally, it is shown that the spatial resolution can be manipulated by carefully preparing the amplitude and phase of the spatial mode profile of the single photon at the input to the microscope objective. Here, the spatial entanglement of the biphoton wavefunction or adaptive optics can be applied for spatial mode shaping. Analytical dependencies between the incident and focused spatial mode profiles parameters are provided.
Higher-order correlations of the radiation field improve resolution in stellar interferometers, as in the Hanbury-Brown–Twiss effect. It is also possible to improve microscopic resolution beyond the Rayleigh limit by using quantum light fields composed of entangled photons. Focusing on two photons, we distinguish two types of entanglement: frequency entanglement, where the photons in different paths are correlated in frequency, and path entanglement, where the correlation between paths is in photon number. Two paradigms of quantum microscopy are discussed: spectral microscopy, where path- and frequency-entangled photons produced in cascade decay of two atoms make possible sub-natural linewidth resolution of atomic levels, and spatial microscopy, where path-entangled photons emitted by an atomic array produce sub-wavelength diffraction resolution as compared to an equivalent classical grating. These scenarios require two-photon correlation or coincidence measurements. The connection between the two paradigms, and the two types of entanglement, highlights the link between the temporal and spatial aspects of quantum interferometry.