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Frontiers in Optics

Rapid High-Dimensional Entanglement Characterization from Compressive Measurements

Gregory A. Howland, John C. Howell

Published Jan 1, 2012• 0 citations
Publisher

Abstract

We experimentally demonstrate rapid characterization of a high-dimensional entangled channel using compressive sensing. Unlike basis scan, this technique effectively scales to large dimensions and efficiently handles very low flux signals.
DOI
10.1364/fio.2012.fm4c.2

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