Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

European Quantum Electronics Conference (EQEC)

Demonstration of entangled-photon ellipsometry

Alexander V. Sergienko, Kimani C. Toussaint, Giovanni Di Giuseppe, Bahaa E. A. Saleh, Malvin Carl Teich

Published Jan 1, 2003• 0 citations
Publisher

Abstract

We report on experimental demonstration of entangled-photon quantum ellipsometry using semiconductor samples.
DOI
10.1109/eqec.2003.1314196

Related papers

Experimental Demonstration of Electron-Photon Entanglement

Isobel Claire Bicket, Alexander Preimesberger, Bogdanov, Sergei +2 more

•Jan 1, 2025•0 citations

Fiber based Scheme for Quantum Ellipsometry

邹雪峰 ZOU Xue-feng, 李凤娇 LI Feng-jiao, 崔亮 Cui Liang +1 more

Acta Sinica Quantum Optica•Jan 1, 2019•0 citations

Experimental multi-photon entanglement and quantum enhanced metrology

Roland Krischek

•Jan 1, 2011•1 citation

Quantum ellipsometry using correlated-photon beams

Kimani C. Toussaint, Giovanni Di Giuseppe, Kenneth J. Bycenski +3 more

We report ellipsometric measurements made on semiconductor samples using photon-correlated beams produced by the process of spontaneous parametric down-conversion. Such a source yields higher accuracy than its quantum-limited conventional counterpart. We also show that our approach has the added advantage of not requiring an external reference sample for calibration.

Physical Review A•Aug 9, 2004•33 citations

Entangled-photon ellipsometry

Alexander V. Sergienko, Ayman F. Abouraddy, Kimani C. Toussaint +2 more

We present a novel quantum interferometric technique to perform ellipsometric measurements. Classical ellipsometric measurements are limited in their accuracy by virtue of the need for an absolutely calibrated source and detector. Mitigating this limitation requires the use of a well-characterized reference sample. Our technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. We have demonstrated that entangled-photon ellipsometry eliminates the necessity of constructing an interferometer altogether and is thereby self-referencing. The underlying physics that leads to this remarkable result is the presence of fourth-order (coincidence) quantum interference of the photon pairs in conjuction with polarization entanglement.

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE•Nov 18, 2003•0 citations

Polarization Entangled Photons from Semiconductor Quantum Dots

Fei Ding, Oliver G. Schmidt

Nano-optics and nanophotonics•Jan 1, 2017•0 citations
We present a novel quantum interferometric technique to perform ellipsometric measurements. Classical ellipsometric measurements are limited in their accuracy by virtue of the need for an absolutely calibrated source and detector. Mitigating this limitation requires the use of a well-characterized reference sample. Our technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. We have demonstrated that entangled-photon ellipsometry eliminates the necessity of constructing an interferometer altogether and is thereby self-referencing. The underlying physics that leads to this remarkable result is the presence of fourth-order (coincidence) quantum interference of the photon pairs in conjuction with polarization entanglement.