AIP conference proceedings

Imaging trapped ions with an integrated microfabricated optic

Erik W. Streed, B. G. Norton, Till J. Weinhold, D. Kielpinski, Timothy C. Ralph, Ping Koy Lam

Published Jan 1, 2011• 0 citations

Abstract

We have integrated a microfabricated phase Fresnel lens (PFL) with an ion trap and used it to image a 174Yb+ ion. The observed collection efficiency was 4.1± 1.3%, in agreement with a predicted performance of 4.6% based on optical characterization and suitable for use in quantum computing. A maximum signal to background scatter noise of 23±4 was measured near saturation intensity (s = 0.7). The depth of focus was 11 μm and the field of view in excess of 100 μm across.

DOI: 10.1063/1.3630177

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