Interest in superconducting transistors is due to some potential benefits of these devices, such as the possibility to have large current gain and bandwidth at low temperatures. In this work we present experimental results concerning with a new superconducting 3-terminal device showing true transistor-like properties at T=4.2K. It is a stacked double tunnel junction structure where the intermediate film is a bilayer of superconducting Nb with an Al quasiparticle trap which can be either in the superconducting or in the normal metal state. Current amplification factors of up to 2.0 are observed at a temperature of 4.2 K when the Al is superconducting. When the Al is in the normal state, large current gains of more than 50 are observed. The operation is highly directional, i.e. practically no effect is observed when the roles of the injector and detector junctions are reversed. The results are explained according to the recently proposed QUAsiparticle TRApping TRANnsistor model.
Interest in superconducting transistors is due to some potential benefits of these devices, such as the possibility to have large current gain and bandwidth at low temperatures. In this work we present experimental results concerning with a new superconducting 3-terminal device showing true transistor-like properties at T=4.2K. It is a stacked double tunnel junction structure where the intermediate film is a bilayer of superconducting Nb with an Al quasiparticle trap which can be either in the superconducting or in the normal metal state. Current amplification factors of up to 2.0 are observed at a temperature of 4.2 K when the Al is superconducting. When the Al is in the normal state, large current gains of more than 50 are observed. The operation is highly directional, i.e. practically no effect is observed when the roles of the injector and detector junctions are reversed. The results are explained according to the recently proposed QUAsiparticle TRApping TRANnsistor model.
A superconducting transistor with large current gain and bandwidth at low temperatures would have many applications. We have fabricated and tested a new three-terminal superconducting device with transistor-like properties at an operating temperature of 4.2 K. It is based on a stacked double tunnel junction structure where the intermediate film is a bilayer of superconducting Nb and an Al quasiparticle trap which can work either in the superconducting or in the normal metal state. Current amplification factors of up to 2.0 are observed at a temperature of 4.2 K when the Al is superconducting, while large current gains of more than 50 are observed when the Al is in the normal state. The device shows a high degree of unidirectionality. The results can be explained on the basis of the recently proposed QUAsiparticle TRApping TRANsistor, which should have wide applications in detection systems operating at low temperatures.
We have fabricated and studied a stacked superconducting double tunnel junction device with transistor-like properties. The intermediate electrode is a bilayer consisting of a Nb film together with an Al film that acts as a quasiparticle trap. Large current gains of more than 50 are observed at 4.2 K when the Al layer is normal. The operation is highly directional. Results are explained on the basis of trapping of quasiparticles from a superconductor into a normal metal, together with a conversion of relaxation energy into electronic excitations. Similar devices should have wide applications in low-temperature measurement and detection systems.
We report experimental and theoretical results on the current gain in superconductor-ferromagnetic transistors (SFTs) with the SISFIFS structure [where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively]. The Josephson critical current density jcaof the acceptor (SISF) junction in the devices is above 9 kA/cm2, which is higher than that in our previous devices. The critical current gain is defined as |δIca|/|δIi|, where a change |δIi| in the injector (SFIFS junction) current produces a change |δIca| in the acceptor maximum Josephson current. We observed a small-signal gain as high as 7.8 and a large-signal current gain of about 2.2. In addition, we found that the Josephson current of the acceptor junction is sensitive to the state of the ferromagnetic layers. A theoretical model is proposed to describe the nonequilibrium processes in the SFT devices, which agrees with the experimental observations. The calculation shows that, in the present device configuration, the dominant contribution to the gap suppression in the middle Nb electrode is due to the quasiparticle injection; spin injection plays a secondary role. We demonstrate that proper device engineering allows one to efficiently control the maximum Josephson current in the SISF acceptor junction using the quasiparticle injection. We conclude that SFT devices can be used as input/output isolators and amplifiers for memory, digital, and RF applications.
We have fabricated and characterized double-barrier multi-terminal superconducting transistor-like devices with the Nb/Al/AlOx/Al/Nb/Ni/Al/AlOx/Al/Nb (S1IS2FIS3) structure, where S, I, and F refer to superconducting, insulating, and ferromagnetic layers, respectively. A thin ferromagnetic Ni layer screens the superconductivity of the middle Nb layer on the injector-barrier side, so that the Nb/Ni bilayer manifests itself as a superconductor in the current-voltage characteristic (I-V curve) of the acceptor S1IS2junction, but as a normal metal in the I-V curve of the injector S2FIS3junction. It is shown that this property allows for considerable improvement of the input-output isolation of the quasiparticle-injection devices as compared with that for the formerly reported quiteron.
Nb/Al–AlOx–Nb/Al–AlOx–Nb double-barrier three-terminal Josephson devices with a thin middle Nb/Al bilayer, which have potential for use as switching and amplifying elements in superconducting electronics, have been investigated in the stationary state by means of low-temperature scanning electron microscopy. For the devices with lateral sizes comparable with the effective Josephson penetration depth, we observed nearly homogeneous current distribution over the region common to the top and bottom junctions when the devices were biased across both the barriers in the absence of an external magnetic field. When the two junctions are biased separately, the current is concentrated at the junction edges in accordance with the behavior characteristic of distributed junctions. In an applied magnetic field, the vortex structure is confined to the area shared by both junctions when the device is biased as a whole. The experiment gives an indication that in the stationary state the spatial phase difference distribution of the two junctions coincides in the shared region at least in some interval of the external magnetic field.
We report experimental results on characteristics of SFIFS junctions and multi-terminal SFIFSIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively). The SFIFS junctions serve as injectors in the SFIFSIS devices which have transistor-like properties; for this reason we call them Superconducting-Ferromagnetic Transistors (SFTs). We have found the F (Ni) thickness at which the SFIFS current-voltage characteristic (CVC) becomes linear. Furthermore, we investigated the DC and AC characteristics of SFTs of two types: ordinary devices with a single acceptor (SIS) junction, and devices with a double acceptor. In the first case, we focused on studying the influence of the injection current through the SFIFS junction on the maximum Josephson current of the SIS acceptor. For devices of the second type, we studied voltage amplification properties when the operating point was chosen in the sub-gap region of the acceptor CVC. By applying an AC signal (in the kHz range) while biasing the injector (SFIFS) junction with a constant DC current, we observed a voltage gain above 25 on the double acceptor. In the reverse transmission experiment, we applied DC current and an AC modulation to the acceptor junction and, within the accuracy of the experiment, observed no response on the injector junction, which implies an excellent input-output isolation in our SFIFSIS devices. The experiments indicate that, after optimization of the device parameters, they can be used as input/output isolators and amplifiers for memory, digital, and RF applications.