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Journal of the Korean Physical Society

A Comparison of Pulsed and Continuous Atom Transfer between Two Magneto-optical Traps

Surjya Prakash Ram, S. K. Tiwari, Satya Ram Mishra

Published Nov 15, 2010• 3 citations
Publisher
DOI
10.3938/jkps.57.1303

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In our double magneto-optical trap (MOT) setup containing a vapor chamber MOT (VC-MOT) and an ultra high vacuum MOT (UHV-MOT) for 87^{87}87Rb atoms, we find that transfer of atoms from VC-MOT to UHV-MOT can be enhanced by employing a pulsed VC-MOT loading followed by a pulsed push beam, as compared to that obtained by focusing a continuous wave (CW) push beam on a continuously loaded VC-MOT. By choosing appropriately the VC-MOT duration and push beam duration, the number of atoms in UHV-MOT was $\sim$3-times the number obtained with a continuous VC-MOT and a CW push beam of optimized power. The processes affecting the pulsed transfer have been studied.
We demonstrated two experimental methods of producing and guiding pulsed atomic beams on chip. One is to trap atoms first in a U-type magneto-optical trap on the chip, then transfer them to the magnetic guide field and push them simultaneously by a continuous force from the power imbalance of the magneto-optical trap laser beams hence the pulsed cold atom beams are produced and move along the magnetic guide to the destination. The other is to trap atoms directly by a H-type magneto-optical trap, then push them to make them move along the magnetic guide field, thus high rate cold atom beams can be produced and guided on the chip.