Journal of Applied Physics
Optimization of charge sensitivity of a single electron tunneling transistor with a superconducting grain
Ulrik Hanke, K. A. Chao, Y. M. Galperin
Abstract
Assuming the absence of 1/f noise, we have calculated the charge sensitivity (CS) of a capacitive-coupled double-junction single electron tunneling transistor (SETT) with a superconducting grain, operating at low temperature and low bias voltage such that the tunneling current is dominated by the Andreev process. In this case the effect of co-tunneling is suppressed without using the complicated fabrication method. We have used a realistic sample to demonstrate the procedure of optimizing the CS of a SETT with respect to relevant physical parameters and structure parameters. With the presently available fabrication technology, our theoretical analysis can serve as a guide for increasing the CS of a SETT beyond 10−6 e/√Hz.