Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Bloch oscillating transistor as the readout element for hot electron bolometers
Juha Hassel, Heikki Seppä, Rene K. Lindell, Pertti Juhani Hakonen
Abstract
In this paper we analyse the properties of the Bloch oscillating transistor as a preamplifier in cryogenic devices. We consider here especially the readout of hot electron bolometers (HEBs) based on Normal-Superconductor-Insulator tunnel junctions, but the results also apply more generally. We show that one can get an equivalent noise voltage below 1 nV/&sqrt;Hz with a single BOT. By using N BOTs in a parallel array configuration, a further reduction by factor &sqrt;N may be achieved.