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Laser Physics Letters

Implementation of 1.6 Tb s−1 truly random number generation based on a super-luminescent emitting diode

Yijia Liu, M-Y Zhu, Bin Luo, J. W. Zhang, Hong Mei Guo

Published Feb 14, 2013• 37 citations
Publisher

Abstract

Using a super-luminescent emitting diode (SLED) source with a linewidth of more than 60 nm, we realize truly random number generation up to 100 Gb s −1 by directly measuring the intensity noise, which originates from the fluctuations of spontaneous emissions. Furthermore, we propose a post-processing method in an over-sampling scheme by eliminating the correlation between adjacent samples, and achieve an ultra-high truly random number generation rate of 1.6 Tb s −1 . The randomness of the generated bit stream is verified using standard statistical test suites (Diehard and NIST-STS), and evaluated using a three-standard-deviation criterion and Shannon entropy estimation.

DOI
10.1088/1612-2011/10/4/045001

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We present a simple setup to implement truly random number generator based on the measurement of the laser phase noise. From the entropy point of view, we estimate the number of truly random bits that can be extracted from the sampled Byte. With a simple method of adopting the mmm-least-significant-bit, we amplify the entropy of the original bit sequence and realize a truly random bit generation rate of 300300300 Mbps.
True random number generators, which output truly random numbers by extracting entropy from physical phenomena such as thermal and electronic noises, are widely used in the field of the cryptographic communication systems. We have been developing a superconductive true random number generator that can generate truly random number sequences, impossible to be predicted, by utilizing the high-speed operation and high-sensitivity of superconductive integrated circuits. In this study, we have calculated the dependences of correlation of output random bits on the generation rate. Statistical tests have been performed on the basis of the NIST statistical test suite in order to evaluate the quality of the randomness of sequences generated by the superconductive true random number generator at high generation rate. We have generated a random number sequence consisting of 3.2 M-bit at the generation rate of 30 Gbit/s using the superconductive true random number generator, fabricated by the ISTEC-SRL 2.5 kA/cm2Nb standard process. The generated random number sequences passed 13 kinds of the statistical tests in the NIST statistical test suit, although the 3 tests were not performed because of the shortage of the generated random numbers. The result sufficiently proves that a superconductive true random number generator can generate a high quality of random numbers that can be used for practical cryptographic applications, at a generation rate of up to 30 Gbit/s.
We report the sampling rate dependency of a single-bit quantum random number generation scheme using a filtered and amplified source of amplified spontaneous emission (ASE). The quality of randomness is measured by the number of passed NIST statistical randomness tests. The number decreases for almost all cases when increasing the sampling rate. We apply a simple self-delay XOR post-processing technique, drastically improving the quality for low sampling rates. However, sampling rates higher than the analog bandwidth of the sampled intensity fluctuations are found to be ineligible for the generation scheme.
Phase randomization is essential for the security of practical decoy-state quantum key distribution (QKD) systems. Commonly, implementations rely on laser sources which are either actively phase-randomized, or gain-switched. However, at high repetition rates these show correlations, which can ultimately compromise security and performance. We present a 1.25 GHz phase-randomized QKD source based on a super-luminescent light emitting diode (SLED) operating in the C-band as a compact and cost-effective alternative. The source generates ∼100\sim100∼100 ps optical pulses with 400400400 ps pulse-to-pulse separation, compatible with high-speed time-bin encoding. Interferometric measurements demonstrate >99%>99\%>99% visibility between adjacent time bins, confirming strong first-order coherence within the same quantum signals, while the spontaneous-emission-driven nature of the SLED ensures intrinsic global phase randomization between adjacent signals. This work establishes a scalable SLED-based platform for high-speed prepare-and-measure QKD systems.