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Quantum Electronics and Laser Science Conference

Atom deflector with optical near fields

K. Totsuka, Kazunobu Yamada, Hajime Ito, Motoichi Ohtsu

Published Jun 25, 2003• 1 citation
Publisher

Abstract

Summary form only given. For atom-deflection experiments, we have previously fabricated a slit-type atom detector with a spatial resolution of 96 nm and a detection efficiency of more than 10% for slow Rb atoms. We are planning to use the detector. In this paper, we report a slit-type atom deflector for Rb atoms. The deflector has a structure suitable for the use in combination with the slit-type detector.

DOI
10.1109/qels.2002.1031100

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Summary form only given. For atom-deflection experiments, we have previously fabricated a slit-type atom detector with a spatial resolution of 96 nm and a detection efficiency of more than 10% for slow Rb atoms. We are planning to use the detector. In this paper, we report a slit-type atom deflector for Rb atoms. The deflector has a structure suitable for the use in combination with the slit-type detector.
We describe a slit-type detector for ground-state atoms with nanometer optical near fields. The detector with a slit width of 70 nm and a slit length of 100 µm is fabricated by processing a silicon-on-insulator wafer with photolithography and anisotropic etching. Measurement with a fiber probe of the intensity distribution on the slit reveals that the spatial resolution is 96 nm. Rubidium atoms can be selectively detected by means of two-step photoionization. The detection efficiency is estimated at 25% for Rb atoms with a mean velocity of 10 m/s. The atom detector can be used for atom deflection experiments with a fiber probe.
Summary form only given. We have proposed deflection by an optical near field on a fiber probe to control atoms with high spatial accuracy. In this case, the deflection angle is estimated to be 0.1 degree for a Rb atom with an incident velocity of 10 m/s. It leads to the deviation of 10 /spl mu/m from the incident axis at 1 cm. in the downstream. To detect the deflected atoms with an accuracy of 1%, we need the spatial resolution of 100 nm. However, a commercial detector such as MCP has a low resolution of 50 /spl mu/m at most and the highest resolution that has been reported is 1 /spl mu/m to our knowledge. In addition, these are applied to metastable atoms and have less detection efficiency for the ground state atoms we manipulate. For drastic improvement, we present here a slit-type atom detector with a nanometric lateral resolution. Since the number of atoms deflected by the optical near field is very small, it is important to detect atoms with high efficiency. For this purpose, we use photoionization with two-color optical near fields.
We describe atom deflection with a slit-type deflector as an elemental technique of precise atom control using near-field light. In the demonstration experiments, cold Rb atoms deflected by repulsive near-field light induced in a 200?nm-wide slit are detected by means of two-step photoionization. Then, we consider a near-field-light lens of atomic de Broglie waves by developing the atom deflector. The feasibility of nanofocusing is shown by numerical analyses with Fourier atom optics. Finally, we describe atom funnels with evanescent light to generate a cold atomic beam required for atom manipulation using nanometric near-field light. The flux intensity of cold Rb atoms outputted from a 240??m outlet is estimated to be 7.5 ? 107?atom?cm?2?s?1 at a blue detuning of 1.2?GHz. In order to increase the flux intensity to 1012?atom?cm?2?s?1, we develop a Si-made funnel with a micron-sized outlet.
We present a new scheme of atom manipulation by means of a sharpened optical fiber with near-field light. In particular, we discuss the feasibility of deflecting and trapping Rb atoms. The optical potential produced by the dipole force is estimated from numerical calculations based on the Yukawa-type intensity distribution. We show that a slow Rb atom can be deflected at a large deflection angle. A static atom trap can be made near the tip of a sharpened fiber. A cold Rb atom is captured at the minimum of the trap potential composed of the repulsive optical potential and the attractive van der Waals potential. A spatial intensity distribution of an optical near-field produced near the tip of a protrusion-type fiber is measured in the fiber-to-probe configuration with a shear-force technique. We also describe an atom funnel to form a cold atomic beam required for the near-field light manipulation.