Optical and Microwave Properties of Focused Ion Beam Implanted Erbium Ions in Y2SiO5 Crystals
Nadezhda Kukharchyk, Sebastian Probst, Shovon Pal, Kangwei Xia, Roman L. Kolesov, Arne Ludwig, Alexey Vladimirovich Ustinov, Pavel A. Bushev, Andreas Dirk Wieck