Superconducting quantum circuits underpin large-scale quantum processors and are increasingly interfaced with optical systems, yet they are vulnerable to quasiparticle poisoning from high-energy radiation and optical fields. Gap engineering of Josephson junctions suppresses quasiparticle-induced relaxation, but quasiparticles near the junction can still shift the qubit frequency and cause phase errors. Here, we extend gap engineering beyond the junction using a flux-tunable transmon with a gold-on-niobium ground plane and island and strongly gap-engineered aluminum junctions designed to keep quasiparticles away from the junction leads. Compared with an all-aluminum transmon with nominally identical junctions, we demonstrate that the niobium device withstands more than an order of magnitude higher near-infrared optical power before excess relaxation appears. The Nb transmon shows no resolvable quasiparticle-induced frequency shift over the same power range. At the same time, we observe that dephasing and state-preparation-and-measurement infidelity increase with optical power even while relaxation remains protected. These results suggest that engineering the quasiparticle energy landscape beyond the junction can substantially increase qubit resilience, not only to radiation-induced error bursts, but also to nearby optical fields.
Superconducting quantum circuits underpin large-scale quantum processors and are increasingly interfaced with optical systems, yet they are vulnerable to quasiparticle poisoning from high-energy radiation and optical fields. Gap engineering of Josephson junctions suppresses quasiparticle-induced relaxation, but quasiparticles near the junction can still shift the qubit frequency and cause phase errors. Here, we extend gap engineering beyond the junction using a flux-tunable transmon with a gold-on-niobium ground plane and island and strongly gap-engineered aluminum junctions designed to keep quasiparticles away from the junction leads. Compared with an all-aluminum transmon with nominally identical junctions, we demonstrate that the niobium device withstands more than an order of magnitude higher near-infrared optical power before excess relaxation appears. The Nb transmon shows no resolvable quasiparticle-induced frequency shift over the same power range. At the same time, we observe that dephasing and state-preparation-and-measurement infidelity increase with optical power even while relaxation remains protected. These results suggest that engineering the quasiparticle energy landscape beyond the junction can substantially increase qubit resilience, not only to radiation-induced error bursts, but also to nearby optical fields.
The performance of various superconducting devices operating at ultra-low temperatures is impaired by the presence of non-equilibrium quasiparticles. Inelastic quasiparticle (QP) tunneling across Josephson junctions in superconducting qubits results in decoherence and spurious excitations and, notably, can trigger correlated errors that severely impede quantum error correction. In this work, we use "gap engineering" to suppress the tunneling of low-energy quasiparticles in Al-based transmon qubits, a leading building block for superconducting quantum processors. By implementing potential barriers for QP, we strongly suppress QP tunneling across the junction and preserve charge parity for over 103 seconds. The suppression of QP tunneling also results in a reduction in the qubit energy relaxation rates. The demonstrated approach to gap engineering can be easily implemented in all Al-based circuits with Josephson junctions.
Quantum error correction will be an essential ingredient in realizing fault-tolerant quantum computing. However, most correction schemes rely on the assumption that errors are sufficiently uncorrelated in space and time. In superconducting qubits, this assumption is drastically violated in the presence of ionizing radiation, which creates bursts of high-energy phonons in the substrate. These phonons can break Cooper pairs in the superconductor and, thus, create quasiparticles over large areas, consequently reducing qubit coherence across the quantum device in a correlated fashion. A potential mitigation technique is to place large volumes of normal or superconducting metal on the device, capable of reducing the phonon energy to below the superconducting gap of the qubits. To investigate the effectiveness of this method, we fabricate a quantum device with four nominally identical nanowire-based transmon qubits. On the device, half of the niobium-titanium-nitride ground plane is replaced with aluminum (Al), which has a significantly lower superconducting gap. We deterministically inject high-energy phonons into the substrate by voltage biasing a galvanically isolated Josephson junction. In the presence of the small-gap material, we find a factor of 2--5 less degradation in the injection-dependent qubit lifetimes and observe that the undesired excited qubit state population is mitigated by a similar factor. We furthermore turn the Al normal with a magnetic field, finding no change in the phonon protection. This suggests that the efficacy of the protection in our device is not limited by the size of the superconducting gap in the Al ground plane. Our results provide a promising foundation for protecting superconducting-qubit processors against correlated errors from ionizing radiation.
Impacts from high-energy particles cause correlated errors in superconducting qubits by increasing the quasiparticle density in the vicinity of the Josephson junctions (JJs). Such errors are particularly harmful as they cannot be easily remedied via conventional error correcting codes. Recent experiments reduced correlated errors by making the difference in superconducting gap energy across the JJ larger than the qubit transition energy. In this work, we assess gap engineering near the JJ (δΔJJ) and the capacitor/ground-plane (δΔM1) by exposing arrays of transmon qubits to two sources of radiation. For α-particles from an 241Am source, we observe T1 errors correlated in space and time, supporting a hypothesis that hadronic cosmic rays are a major contributor to the 10−10 error floor observed in Ref. 1. For electrons from a pulsed linear accelerator, we observe temporally correlated T1 and T2 errors, this measurement is insensitive to spatial correlations. We observe that the severity of correlated T1 errors is reduced for qubit arrays with a greater degree of gap engineering at the JJ. For both T1 and T2 errors, the recovery time is hastened by an increased δΔM1, which we attribute to the trapping of quasiparticles into the capacitor/ground-plane. We construct a model of quasiparticle dynamics that qualitatively agrees with our observations. This work reinforces the multifaceted influence of radiation on superconducting qubits and provides strategies for improving radiation resilience.
Quantum error correction (QEC) provides a practical path to fault-tolerant quantum computing through scaling to large qubit numbers, assuming that physical errors are sufficiently uncorrelated in time and space. In superconducting qubit arrays, high-energy impact events can produce correlated errors, violating this key assumption. Following such an event, phonons with energy above the superconducting gap propagate throughout the device substrate, which in turn generate a temporary surge in quasiparticle (QP) density throughout the array. When these QPs tunnel across the qubits' Josephson junctions, they induce correlated errors. Engineering different superconducting gaps across the qubit's Josephson junctions provides a method to resist this form of QP tunneling. By fabricating all-aluminum transmon qubits with both strong and weak gap engineering on the same substrate, we observe starkly different responses during high-energy impact events. Strongly gap engineered qubits do not show any degradation in T_{1} during impact events, while weakly gap engineered qubits show events of correlated degradation in T_{1}. We also show that strongly gap engineered qubits are robust to QP poisoning from increasing optical illumination intensity, whereas weakly gap engineered qubits display rapid degradation in coherence. Based on these results, gap engineering mitigates the threat of high-energy impacts to QEC in superconducting qubit arrays.
One of the roadblocks toward the implementation of a fault-tolerant superconducting quantum processor is impacts of ionizing radiation with the qubit substrate. Such impacts temporarily elevate the density of quasiparticles (QPs) across the device, leading to correlated qubit error bursts. The most damaging errors, T 1 errors, stem from QP tunneling across the qubit Josephson junctions (JJs). Recently, we demonstrated [M. McEwen, K. Miao, , ] that this type of error can be strongly suppressed by engineering the profile of superconducting gap at the JJs in a way that prevents QP tunneling. In this work, we identify a new type of impact-induced correlated error that persists in the presence of gap engineering. We observe that impacts shift the frequencies of the affected qubits, and thus lead to correlated phase errors. The frequency shifts are systematically negative, reach values up to 3 MHz, and last for ∼ 1 ms . We provide evidence that the shifts originate from QP-qubit interactions in the JJ region. Further, we demonstrate that the shift-induced phase errors can be detrimental to the performance of quantum error correction protocols.
Superconducting qubits based on Josephson junctions have emerged as a leading hardware platform in the quest to realize large-scale quantum computers. However, qubit decoherence remains a major hurdle on the path toward fault-tolerant quantum computing. In particular, excess quasiparticle (QP) excitations constitute a significant source of dissipation in superconducting quantum devices. The empirically observed QP density in these systems is orders of magnitude larger than that predicted by Bardeen-Cooper-Schrieffer (BCS) theory. Moreover, QP poisoning due to high-energy particle impacts can cause correlated errors that simultaneously affect multiple qubits, thereby impeding quantum error correction. Although QP-induced decoherence has been extensively studied in widely implemented transmon qubits, its impact on fluxonium qubits, a leading alternative architecture, remains far less explored. In this thesis, we investigate energy relaxation in fluxonium qubits induced by controlled QP poisoning using an on-chip Josephson injector junction that generates Cooper-pair-breaking phonons and photons. We separately measure the relaxation and excitation rates, instead of the conventional energy relaxation time. For specific injection parameters, we observe an apparent reversal of the rates, with the excitation rate exceeding the relaxation rate. We further measure the rates as a function of external flux to disentangle the effects of QP tunneling across the small junction and the junction array superinductor. Across all measured samples, differing in qubit spectra and injection conditions, we infer roughly an order of magnitude higher QP density at the small junction than in the array junctions. Our findings advance the understanding of QP-induced decoherence in fluxonium qubits and provide insight for reconciling discrepancies in reported bounds on QP densities, potentially enabling the development of QP mitigation strategies tailored to fluxonium qubits.